The Enhanced Role of Shallow-Trench Isolation in Ionizing Radiation Damage of 65 nm RF-CMOS on SOI
Madan, A., Verma, R., Arora, R., Wilcox, E.P., Cressler, J.D., Marshall, P.W., Schrimpf, R.D., Cheng, P.F., Del Castillo, L.Y., Qingqing Liang, Freeman, G.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Harsh environment microtechnologies for NASA and terrestrial applications
George, T., Son, K.A., Powers, R.A., Del Castillo, L.Y., Okojie, R.
Published in IEEE Sensors, 2005 (2005)
Published in IEEE Sensors, 2005 (2005)
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Conference Proceeding