Machine learning based test pattern analysis for localizing critical power activity areas
Dhotre, Harshad, Eggersglus, Stephan, Dehbashi, Mehdi, Pfannkuchen, Ulrike, Drechsler, Rolf
Published in 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2017)
Published in 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2017)
Get full text
Conference Proceeding
Allameh Tabatabaei’s Structure of Thought: Moderate Rationalism and Wisely Faithfulness
esmat hemmaty, mehdi dehbashi
Published in Ḥikmat-i muʻāṣir. : dū faṣlʹnāmah-i ʻilmī, takhaṣṣuṣī (01.12.2016)
Get full text
Published in Ḥikmat-i muʻāṣir. : dū faṣlʹnāmah-i ʻilmī, takhaṣṣuṣī (01.12.2016)
Journal Article
Design and Validation of Brain-based Aesthetic Curriculum
Madineh Alikhani, Maryam Baratali, Jahanbakhsh Rahmani, Mehdi Dehbashi
Published in پژوهش در نظامهای آموزشی (01.09.2021)
Get full text
Published in پژوهش در نظامهای آموزشی (01.09.2021)
Journal Article
Judgment about Freedom
Alizamani , Amir Abbas, Givi , Majid, Mazaheri , Mohammad Mehdi, Dehbashi , Mehdi
Published in Kuwait chapter of Arabian journal of business & management review (01.04.2014)
Published in Kuwait chapter of Arabian journal of business & management review (01.04.2014)
Get full text
Journal Article
Automated Optimization of Scan Chain Structure for Test Compression-Based Designs
Dhotre, Harshad, Dehbashi, Mehdi, Pfannkuchen, Ulrike, Hofmann, Klaus
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)
Get full text
Conference Proceeding
Debug Automation for Synchronization Bugs at RTL
Dehbashi, Mehdi, Fey, Görschwin
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)
Get full text
Conference Proceeding
Journal Article
Automated design debugging in a testbench-based verification environment
Dehbashi, Mehdi, Sülflow, André, Fey, Görschwin
Published in Microprocessors and microsystems (01.03.2013)
Published in Microprocessors and microsystems (01.03.2013)
Get full text
Journal Article
Constraint-Based Pattern Retargeting for Reducing Localized Power Activity During Testing
Dhotre, Harshad, Eggersgluss, Stephan, Drechsler, Rolf, Dehbashi, Mehdi, Pfannkuchen, Ulrike
Published in 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (01.04.2018)
Published in 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (01.04.2018)
Get full text
Conference Proceeding
SAT-based speedpath debugging using X traces
Dehbashi, Mehdi, Fey, Gorschwin
Published in 2014 9th International Design and Test Symposium (IDT) (01.12.2014)
Published in 2014 9th International Design and Test Symposium (IDT) (01.12.2014)
Get full text
Conference Proceeding
Sat-based speedpath debugging using waveforms
Dehbashi, Mehdi, Fey, Gorschwin
Published in 2014 19th IEEE European Test Symposium (ETS) (01.05.2014)
Published in 2014 19th IEEE European Test Symposium (ETS) (01.05.2014)
Get full text
Conference Proceeding