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by Fang, Guanqi, Pan, Rong, Wang, Yukun
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Published in Microelectronics and reliability (01.09.2019)

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Published in Reliability engineering & system safety (01.12.2021)

by Wang, Zhijie, Zhai, Qingqing, Shen, Lijuan
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Published in Reliability engineering & system safety (01.03.2019)

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by Liu, Xingheng, Lunde, Erling, Diehl, Fabio, Zhang, Aibo, Vatn, Jørn, Yin, Shen
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by Srivastav, Himanshu, Lundteigen, Mary Ann, Barros, Anne
Published in Reliability engineering & system safety (01.12.2021)

by Dafalla, Ahmed Mohmed, Wei, Lin, Habte, Bereket Tsegai, Guo, Jian, Jiang, Fangming
Published in Energies (Basel) (01.12.2022)

by Cao, Xuerui, Peng, Kaixiang, Jiao, Ruihua
Published in Computers & industrial engineering (01.09.2024)

by Huang, Tingting, Peng, Bo, Coit, David W., Yu, Zixuan
Published in IEEE transactions on reliability (01.09.2019)

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Published in IEEE sensors journal (15.11.2023)