by Jain, Vikram, Giraldo, Sebastian, Roose, Jaro De, Mei, Linyan, Boons, Bert, Verhelst, Marian
Published in IEEE journal of solid-state circuits (01.08.2023)

by De Roose, Jaro, Andraud, Martin, Verhelst, Marian
Published in Frontiers in electronics (Online) (27.06.2022)

by Feyerick, Maxime, De Roose, Jaro, Verhelst, Marian
Published in 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2019)

by Jain, Vikram, Giraldo, Sebastian, Roose, Jaro De, Boons, Bert, Mei, Linyan, Verhelst, Marian
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)

by De Roose, Jaro, Xin, Haoming, Andraud, Martin, Harpe, Pieter J.A., Verhelst, Marian
Published in ESSCIRC 2018 - IEEE 44th European Solid State Circuits Conference (ESSCIRC) (01.09.2018)

by De Roose, Jaro, Xin, Haoming, Hallawa, Ahmed, Ascheid, Gerd, Harpe, Pieter J. A., Verhelst, Marian
Published in IEEE solid-state circuits letters (2020)

by Andraud, Martin, Berkol, Gonenc, De Roose, Jaro, Gannavarapu, Santosh, Haoming Xin, Cantatore, Eugenio, Harpe, Pieter J. A., Verhelst, Marian, Baltus, Peter G. M.
Published in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 (01.03.2017)

by Jain, Vikram, Giraldo, Sebastian, De Roose, Jaro, Linyan Mei, Boons, Bert, Verhelst, Marian
Published in arXiv.org (09.01.2023)