by Mainguet, JF, Gallaire, D., Martinent, A., Revaux, A., Benwadih, M., Charlot, S., van Breemen, A. J. J. M, van der Steen, J.- L., Akkerman, H. B., Kronemeijer, A. J., Gelinck, G. H., Pouet, M., Fourre, J.-Y., Sinopoli, S., Emanuele, U., Fritsch, L., Jimenez, J. Liu, Karlsson, J., De Roose, F., Steudel, S.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)