Stress Analysis on Ultra Thin Ground Wafers
Teixeira, Ricardo C., De Munck, Koen, De Moor, Piet, Baert, Kris, Swinnen, Bart, Van Hoof, Chris, Knüettel, Alexsander
Published in Journal of Integrated Circuits and Systems (18.11.2020)
Published in Journal of Integrated Circuits and Systems (18.11.2020)
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Journal Article
Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor
Vereecke, Bart, Cavaco, Celso, De Munck, Koen, Haspeslagh, Luc, Minoglou, Kyriaki, Moore, George, Sabuncuoglu, Deniz, Tack, Klaas, Wu, Bob, Osman, Haris
Published in Japanese Journal of Applied Physics (01.04.2015)
Published in Japanese Journal of Applied Physics (01.04.2015)
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Journal Article
A Backside-Illuminated Charge-Focusing Silicon SPAD With Enhanced Near-Infrared Sensitivity
Van Sieleghem, Edward, Karve, Gauri, De Munck, Koen, Vinci, Andrea, Cavaco, Celso, Suss, Andreas, Van Hoof, Chris, Lee, Jiwon
Published in IEEE transactions on electron devices (01.03.2022)
Published in IEEE transactions on electron devices (01.03.2022)
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Journal Article
A Near-Infrared Enhanced Silicon Single-Photon Avalanche Diode With a Spherically Uniform Electric Field Peak
Van Sieleghem, Edward, Suss, Andreas, Boulenc, Pierre, Lee, Jiwon, Karve, Gauri, De Munck, Koen, Cavaco, Celso, Van Hoof, Chris
Published in IEEE electron device letters (01.06.2021)
Published in IEEE electron device letters (01.06.2021)
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Journal Article
The RELAXd project: Development of four-side tilable photon-counting imagers
Vykydal, Zdenek, Visschers, Jan, Tezcan, Deniz Sabuncuoglu, De Munck, Koen, Borgers, Tom, Ruythooren, Wouter, De Moor, Piet
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.06.2008)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.06.2008)
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Journal Article
Process induced sub-surface damage in mechanically ground silicon wafers
Yang, Yu, De Munck, Koen, Teixeira, Ricardo Cotrin, Swinnen, Bart, Verlinden, Bert, De Wolf, Ingrid
Published in Semiconductor science and technology (01.07.2008)
Published in Semiconductor science and technology (01.07.2008)
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Journal Article
On the processing aspects of high performance hybrid backside illuminated CMOS imagers
De Vos, Joeri, De Munck, Koen, Minoglou, Kiki, Rao, Padmakumar Ramachandra, Erismis, Mehmet Akif, De Moor, Piet, Tezcan, Deniz Sabuncuoglu
Published in Journal of micromechanics and microengineering (01.07.2011)
Published in Journal of micromechanics and microengineering (01.07.2011)
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Journal Article
Conference Proceeding
High performance Hybrid and Monolithic Backside Thinned CMOS Imagers realized using a new integration process
De Munck, K., Sabuncuoglu Tezcan, D., Borgers, T., Ruythooren, W., De Moor, P., Sedky, S., Toccafondi, C., Bogaerts, J., Van Hoof, C.
Published in 2006 International Electron Devices Meeting (01.12.2006)
Published in 2006 International Electron Devices Meeting (01.12.2006)
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Conference Proceeding
Influence of Extreme Thinning on 130-nm Standard CMOS Devices for 3-D Integration
De Munck, K., Chiarella, T., De Moor, P., Swinnen, B., Van Hoof, C.
Published in IEEE electron device letters (01.04.2008)
Published in IEEE electron device letters (01.04.2008)
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Journal Article
A Backside-Illuminated Charge-Focusing Silicon SPAD with Enhanced Near-Infrared Sensitivity
Edward Van Sieleghem, Karve, Gauri, De Munck, Koen, Vinci, Andrea, Cavaco, Celso, Süss, Andreas, Chris Van Hoof, Lee, Jiwon
Published in arXiv.org (03.03.2022)
Published in arXiv.org (03.03.2022)
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Paper
Journal Article
Hybrid Backside Illuminated CMOS Imager for High-End Applications
De Vos, Joeri, De Munck, Koen, Erismis, Mehmet Akif, Minoglou, Kiki, Rao, Padmakumar Ramachandra, Zhang, Wenqi, Sabuncuoglu Tezcan, Deniz, De Moor, Piet, Soussan, Philippe
Published in ECS transactions (01.01.2011)
Published in ECS transactions (01.01.2011)
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Journal Article
A Near-Infrared Enhanced Silicon Single-Photon Avalanche Diode with a Spherically Uniform Electric Field Peak
Edward Van Sieleghem, Süss, Andreas, Boulenc, Pierre, Lee, Jiwon, Karve, Gauri, De Munck, Koen, Cavaco, Celso, Chris Van Hoof
Published in arXiv.org (12.05.2021)
Published in arXiv.org (12.05.2021)
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Paper
Journal Article
Enhanced time delay integration imaging using embedded CCD in CMOS technology
De Moor, Piet, Robbelein, Jo, Haspeslagh, Luc, Boulenc, Pierre, Ercan, Alper, Minoglou, Kyriaki, Lauwers, Anne, De Munck, Koen, Rosmeulen, Maarten
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding
Hybrid Backside Illuminated CMOS Imager for High-End Applications
De Vos, Joeri, De Munck, Koen, Erismis, Mehmet Akif, Minoglou, Kiki, Rao, Padmakumar Ramachandra, Zhang, Wenqi, Sabuncuoglu Tezcan, Deniz, De Moor, Piet, Soussan, Philippe
Published in Meeting abstracts (Electrochemical Society) (01.03.2011)
Published in Meeting abstracts (Electrochemical Society) (01.03.2011)
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