Diagnosis and Layout Aware (DLA) Scan Chain Stitching
Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Weipin Changchien, Daw-Ming Lee, Ji-Jan Chen, Eruvathi, Sandeep C., Kumara, Kartik K., Liu, Charles, Sam Pan
Published in IEEE transactions on very large scale integration (VLSI) systems (01.03.2015)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.03.2015)
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Journal Article
Diagnosis and Layout Aware (DLA) scan chain stitching
Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Weipin Changchien, Daw-Ming Lee, Ji-Jan Chen, Eruvathi, Sandeep C., Kumara, Kartik K., Liu, Charles, Sam Pan
Published in 2013 IEEE International Test Conference (ITC) (01.09.2013)
Published in 2013 IEEE International Test Conference (ITC) (01.09.2013)
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Conference Proceeding
Error Injection & Correction: An efficient formal logic restructuring algorithm
Ching-Yi Huang, Daw-Ming Lee, Chun-Chi Lin, Chun-Yao Wang
Published in 2012 International SoC Design Conference (ISOCC) (01.11.2012)
Published in 2012 International SoC Design Conference (ISOCC) (01.11.2012)
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Conference Proceeding