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Analysis of local strain in aluminium interconnects by energy filtered CBED
Krämer, S., Mayer, J., Witt, C., Weickenmeier, A., Rühle, M.
Published in Ultramicroscopy (01.04.2000)
Published in Ultramicroscopy (01.04.2000)
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Optimal experimental design of STEM measurement of atom column positions
Van Aert, S., den Dekker, A.J., Van Dyck, D., van den Bos, A.
Published in Ultramicroscopy (01.04.2002)
Published in Ultramicroscopy (01.04.2002)
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