Hardware-software system for automation of characteristics measurement of SOI CMOS VLSI elements under extreme high temperature conditions (up to 300°C)
Ismail-zade, Mamed R., Romanov, Aleksandr Y., Kuzin, Egor Y., Danykin, Vladimir S., Chetverikov, Igor A.
Published in 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) (2017)
Published in 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) (2017)
Get full text
Conference Proceeding