Search Results - "Danković, D" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Self-heating of stressed VDMOS devices under specific operating conditions

Self-heating of stressed VDMOS devices under specific operating conditions

by Veljković, S., Mitrović, N., Jovanović, I., Živanović, E., Paskaleva, A., Spassov, D., Mančić, D., Danković, D.
Published in Microelectronics and reliability (01.11.2023)

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Journal Article

Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs

Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs

by Danković, D., Davidović, V., Golubović, S., Veljković, S., Mitrović, N., Djorić-Veljković, S.
Published in Microelectronics and reliability (01.11.2021)

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Journal Article

Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications

Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications

by Mitrović, N., Veljković, S., Davidović, V., Djorić-Veljković, S., Golubović, S., Živanović, E., Prijić, Z., Danković, D.
Published in Microelectronics and reliability (01.11.2022)

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Journal Article

NBTI and irradiation related degradation mechanisms in power VDMOS transistors

NBTI and irradiation related degradation mechanisms in power VDMOS transistors

by Stojadinović, N., Djorić-Veljković, S., Davidović, V., Golubović, S., Stanković, S., Prijić, A., Prijić, Z., Manić, I., Danković, D.
Published in Microelectronics and reliability (01.09.2018)

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Journal Article

A review of pulsed NBTI in P-channel power VDMOSFETs

A review of pulsed NBTI in P-channel power VDMOSFETs

by Danković, D., Manić, I., Prijić, A., Davidović, V., Prijić, Z., Golubović, S., Djorić-Veljković, S., Paskaleva, A., Spassov, D., Stojadinović, N.
Published in Microelectronics and reliability (01.03.2018)

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Journal Article

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions

by MANIC, I, DANKOVIC, D, PRIJIC, A, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, PRIJIC, Z, STOJADINOVIC, N
Published in Microelectronics and reliability (01.09.2011)

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Journal Article Conference Proceeding

NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs

NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs

by DANKOVIC, D, MANIC, I, DJORIC-VELJKOVIC, S, DAVIDOVIC, V, GOLUBOVIC, S, STOJADINOVIC, N
Published in Microelectronics and reliability (01.09.2006)

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Journal Article Conference Proceeding

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs

by Stojadinović, N., Danković, D., Djorić-Veljković, S., Davidović, V., Manić, I., Golubović, S.
Published in Microelectronics and reliability (01.09.2005)

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Journal Article Conference Proceeding

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress

by STOJADINOVIC, N, DANKOVIC, D, MANIC, I, PRIJIC, A, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, PRIJIC, Z
Published in Microelectronics and reliability (01.09.2010)

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Journal Article Conference Proceeding

Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs

Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs

by MANIC, I, DANKOVIC, D, DJORIC-VELJKOVIC, S, DAVIDOVIC, V, GOLUBOVIC, S, STOJADINOVIC, N
Published in Microelectronics and reliability (01.09.2009)

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Journal Article Conference Proceeding

Negative bias temperature instability in n-channel power VDMOSFETs

Negative bias temperature instability in n-channel power VDMOSFETs

by Danković, D., Manić, I., Davidović, V., Djorić-Veljković, S., Golubović, S., Stojadinović, N.
Published in Microelectronics and reliability (01.08.2008)

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Journal Article Conference Proceeding

Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs

Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs

by DANKOVIC, D, MANIC, I, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, STOJADINOVIC, N
Published in Microelectronics and reliability (01.09.2007)

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Journal Article Conference Proceeding

The Scientific Basis of Uncertainty Factors Used in Setting Occupational Exposure Limits

The Scientific Basis of Uncertainty Factors Used in Setting Occupational Exposure Limits

by Dankovic, D. A., Naumann, B. D., Maier, A., Dourson, M. L., Levy, L. S.
Published in Journal of occupational and environmental hygiene (2015)

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Journal Article

Burial of a woman with an amber distaff at Viminacium

Burial of a woman with an amber distaff at Viminacium

by Dankovic, Ilija
Published in Starinar (Beograd) (2019)

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Journal Article

A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors

A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors

by Priji, A, Dankovi, D, Vra ar, Lj, Mani, I, Priji, Z, Stojadinovi, N
Published in Measurement science & technology (01.08.2012)

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Journal Article

Anthropomorphic amulets from Viminacium

Anthropomorphic amulets from Viminacium

by Milovanovic, Bebina, Dankovic, Ilija
Published in Starinar (Beograd) (2020)

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Journal Article

Occupational exposure to chrysotile asbestos and cancer risk: a review of the amphibole hypothesis

Occupational exposure to chrysotile asbestos and cancer risk: a review of the amphibole hypothesis

by Stayner, L T, Dankovic, D A, Lemen, R A
Published in American journal of public health (1971) (01.02.1996)

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Journal Article

Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method

Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method

by N. Mitrović, D. Danković, B. Ranđelović, Z. Prijić, N. Stojadinović
Published in Informacije MIDEM (Spletna izd.) (30.11.2020)

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Journal Article

Recovery treatment effects on gamma radiation response in electrically stressed power VDMOS transistors

Recovery treatment effects on gamma radiation response in electrically stressed power VDMOS transistors

by Djorić-Veljković, S., Davidović, V., Danković, D., Manić, I., Golubović, S., Stojadinović, N.
Published in 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 (01.05.2014)

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Conference Proceeding

Is Microelectronics Recognizable in Serbian School System?

Is Microelectronics Recognizable in Serbian School System?

by Marjanovic, M., Mitrovic, N., Veljkovic, S., Zivanovic, E., Dankovic, D.
Published in 2023 IEEE 33rd International Conference on Microelectronics (MIEL) (16.10.2023)

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Conference Proceeding