NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
LIN, Chia-Sheng, CHEN, Ying-Chung, SHIH, Jou-Miao, CHANG, Ting-Chang, JIAN, Fu-Yen, HSU, Wei-Che, KUO, Yuan-Jui, DAI, Chih-Hao, CHEN, Te-Chih, LO, Wen-Hung, HSIEH, Tien-Yu
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation
Wen-hung Lo, Ting-Chang Chang, Chih-Hao Dai, Wan-Lin Chung, Ching-En Chen, Szu-Han Ho, Cheng, Osbert, Cheng Tung Huang
Published in IEEE electron device letters (01.03.2012)
Published in IEEE electron device letters (01.03.2012)
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Journal Article
On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs
Chih-Hao Dai, Ting-Chang Chang, Ann-Kuo Chu, Yuan-Jui Kuo, Shih-Ching Chen, Chih-Chung Tsai, Szu-Han Ho, Wen-Hung Lo, Guangrui Xia, Cheng, Osbert, Cheng Tung Huang
Published in IEEE electron device letters (01.06.2010)
Published in IEEE electron device letters (01.06.2010)
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Journal Article
On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs
Chih-Hao Dai, Ting-Chang Chang, An-Kuo Chu, Yuan-Jui Kuo, Fu-Yen Jian, Wen-Hung Lo, Szu-Han Ho, Ching-En Chen, Wan-Lin Chung, Jou-Miao Shih, Guangrui Xia, Cheng, Osbert, Cheng-Tung Huang
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strain
Dai, Chih-Hao, Chang, Ting-Chang, Chu, Ann-Kuo, Kuo, Yuan-Jui, Chen, Shih-Ching, Tsai, Chih-Tsung, Lo, Wen-Hung, Ho, Szu-Han, Xia, Guangrui, Cheng, Osbert, Huang, Cheng Tung
Published in Surface & coatings technology (25.11.2010)
Published in Surface & coatings technology (25.11.2010)
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Conference Proceeding
Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal–oxide–semiconductor-field-effect-transistors
Lo, Wen-Hung, Chang, Ting-Chang, Dai, Chih-Hao, Chung, Wan-Lin, Chen, Ching-En, Ho, Szu-Han, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Cheng, Osbert, Huang, Cheng-Tung
Published in Thin solid films (15.01.2013)
Published in Thin solid films (15.01.2013)
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Journal Article
Conference Proceeding
Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacks
Dai, Chih-Hao, Chang, Ting-Chang, Chu, Ann-Kuo, Kuo, Yuan-Jui, Hung, Ya-Chi, Lo, Wen-Hung, Ho, Szu-Han, Chen, Ching-En, Shih, Jou-Miao, Chung, Wan-Lin, Chen, Hua-Mao, Dai, Bai-Shan, Tsai, Tsung-Ming, Xia, Guangrui, Cheng, Osbert, Huang, Cheng Tung
Published in Thin solid films (30.12.2011)
Published in Thin solid films (30.12.2011)
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Conference Proceeding
Investigation of Lateral Trap Position by Random Telegraph Signal Analysis in Moderate Inversion in n-Channel MOSFETs
Chen, Ching-En, Chang, Ting-Chang, You, Bo, Lo, Wen-Hung, Ho, Szu-Han, Dai, Chih-Hao, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Guan-Ru, Tai, Ya-Hsiang, Tseng, Tseung-Yuen
Published in ECS solid state letters (04.09.2013)
Published in ECS solid state letters (04.09.2013)
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Journal Article
The Impact of Mechanical Strain on Reliability Issue for PD SOI MOSFETs
Lo, Wen-Hung, Chang, Ting-Chang, Dai, Chih-Hao, Chung, Wan-Lin, Tsai, Jyun-Yu, Chen, Ching-En, Cheng, Osbert, Huang, Cheng Tung
Published in ECS transactions (27.04.2012)
Published in ECS transactions (27.04.2012)
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Journal Article
Investigation of Mechanisms and Random Telegraph Signals in Static and Dynamic BTI Stress on PD SOI MOSFETs
Chen, Ching-En, Chang, Ting-Chang, Lo, Hung-Ping, Lo, Wen-Hung, Ho, Szu-Han, Dai, Chih-Hao, Cheng, Osbert, Huang, Cheng Tung
Published in Meeting abstracts (Electrochemical Society) (15.02.2012)
Published in Meeting abstracts (Electrochemical Society) (15.02.2012)
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Journal Article
Investigation on Hot Carrier Degradation on Ti x N 1-x /HfO 2 MOSFETs
Tsai, Jyun-yu, Chang, Ting-Chang, Lo, Wen-Hung, Dai, Chih-Hao, Chen, Ching-En, Chen, Hua-Mao, Hung, Jian-ming, Cheng, Osbert, Huang, Cheng Tung
Published in Meeting abstracts (Electrochemical Society) (15.02.2012)
Published in Meeting abstracts (Electrochemical Society) (15.02.2012)
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Journal Article
MOSFET having memory characteristics
LO WEN-HUNG, CHANG SHIHIEH, JIAN FU-YEN, WANG YING-LANG, CHANG TINGANG, DAI CHIH-HAO
Year of Publication 18.11.2014
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Year of Publication 18.11.2014
Patent
MOSFET HAVING MEMORY CHARACTERISTICS
LO WEN-HUNG, CHANG SHIHIEH, JIAN FU-YEN, WANG YING-LANG, CHANG TINGANG, DAI CHIH-HAO
Year of Publication 13.02.2014
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Year of Publication 13.02.2014
Patent
Investigation on AC PBI and NBI Stress on Ti x N 1-x /HfO 2 MOSFETs
Ho, Szu-Han, Chang, Ting-Chang, Wu, Chi-Wei, Lo, Wen-Hung, Chen, Ching-En, Dai, Chih-Hao, Tsai, Jyun-yu, Lo, Hung-Ping, Cheng, Osbert, Huang, Cheng Tung
Published in Meeting abstracts (Electrochemical Society) (15.02.2012)
Published in Meeting abstracts (Electrochemical Society) (15.02.2012)
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Journal Article
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
Dai, Chih-Hao, Chang, Ting-Chang, Chu, Ann-Kuo, Kuo, Yuan-Jui, Ho, Szu-Han, Hsieh, Tien-Yu, Lo, Wen-Hung, Chen, Ching-En, Shih, Jou-Miao, Chung, Wan-Lin, Dai, Bai-Shan, Chen, Hua-Mao, Xia, Guangrui, Cheng, Osbert, Huang, Cheng Tung
Published in Electrochemical and solid-state letters (01.01.2012)
Published in Electrochemical and solid-state letters (01.01.2012)
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