by Lin, W.-C., Wu, T.-C., Tsai, Y.-H., Du, L.-J., King, Y.-C.
Published in IEEE transactions on electron devices (01.07.2005)

by LIN, Wei-Cheng, DU, Long-Jei, KING, Ya-Chin
Published in Microelectronics and reliability (01.09.2004)

by LIN, Wei-Cheng, DU, Long-Jei, KING, Ya-Chin
Published in 2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers (2004)

by Wei-Cheng Lin, Long-Jei Du, Ya-Chin King
Published in IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 (2003)

by Wei-Cheng Lin, Long-Jei Du, Ya-Chin King
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by LIN, Wei-Cheng, WU, Tsung-Chien, TSAI, Yi-Hung, DU, Long-Jei, KING, Ya-Chin
Published in IEEE transactions on electron devices (2005)

by LIN, Wei-Cheng, DU, Long-Jei, KING, Ya-Chin
Year of Publication 2004