A new 40-nm SONOS structure based on backside trapping for nanoscale memories
Ranica, R., Villaret, A., Mazoyer, P., Monfray, S., Chanemougame, D., Masson, P., Regnier, A., Dray, C.N., Bez, R., Skotnicki, T.
Published in IEEE transactions on nanotechnology (01.09.2005)
Published in IEEE transactions on nanotechnology (01.09.2005)
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Journal Article
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing
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Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Transitioning eMRAM from Pilot Project to Volume Production
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Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
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Year of Publication 13.04.2020
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Year of Publication 13.04.2020
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High Density STT-MRAM compiler design, validation and characterization methodology in 28nm FDSOI technology
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Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)
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Conference Proceeding
SELECTIVE CLOCK ADJUSTMENT DURING READ ANDOR WRITE MEMORY OPERATIONS
JALLAMION GRIVE YANNIS, SARRAZIN YANN, DRAY CYRILLE NICOLAS, CHEN ANDY WANGKUN, POITRAT JULIEN VINCENT, MATHUR RAHUL, SVEDAS JONAS, KNIGHT GRAHAM PETER, MYERS JAMES EDWARD, PRABHAT PRANAY
Year of Publication 25.06.2020
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Year of Publication 25.06.2020
Patent
APPARATUS FOR LOW POWER WRITE AND READ OPERATIONS FOR RESISTIVE MEMORY
WANG YIH, DRAY CYRILLE, WEI LIQIONG, LIN BLAKE C, AUGUST NATHANIEL J, HAMZAOGLU FATIH
Year of Publication 11.01.2016
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Year of Publication 11.01.2016
Patent
A Compact Model for Scalable MTJ Simulation
García-Redondo, Fernando, Prabhat, Pranay, Bhargava, Mudit, Dray, Cyrille
Year of Publication 09.06.2021
Year of Publication 09.06.2021
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Journal Article
MBIST Support for Reliable eMRAM Sensing
Yun, Jongsin, Nadeau-Dostie, Benoit, Keim, Martin, Dray, Cyrille, Boujamaa, Mehdi
Published in 2020 IEEE European Test Symposium (ETS) (01.05.2020)
Published in 2020 IEEE European Test Symposium (ETS) (01.05.2020)
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Conference Proceeding