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Year of Publication 07.12.2023
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Year of Publication 05.08.2022
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Year of Publication 07.01.2022
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Year of Publication 21.12.2020
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Year of Publication 11.03.2016
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REILLY PATRICK, TE NIJENHUIS HARALD, NDIEGE NICHOLAS MUGA, VAN SCHRAVENDIJK BART J, DRAEGER NERISSA SUE
Year of Publication 06.05.2015
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Year of Publication 06.05.2015
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Year of Publication 29.12.2022
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Predicting etch characteristics in thermal etching and atomic layer etching
Lill, Thorsten, Fischer, Andreas, Draeger, Nerissa Sue, Gottscho, Richard A, Berry, III, Ivan L
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Year of Publication 06.12.2022
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REFLECTIVE FOURIER PTYCHOGRAPHY IMAGING OF LARGE SURFACES
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Year of Publication 10.06.2021
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PREDICTING ETCH CHARACTERISTICS IN THERMAL ETCHING AND ATOMIC LAYER ETCHING
Lill, Thorsten, Fischer, Andreas, Draeger, Nerissa Sue, Gottscho, Richard A, Berry, III, Ivan L
Year of Publication 07.11.2019
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Year of Publication 07.11.2019
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PREDICTING ETCH CHARACTERISTICS IN THERMAL ETCHING AND ATOMIC LAYER ETCHING
DRAEGER, Nerissa Sue, LILL, Thorsten, FISCHER, Andreas, BERRY III, Ivan L, GOTTSCHO, Richard A
Year of Publication 07.11.2019
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Year of Publication 07.11.2019
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Predicting etch characteristics in thermal etching and atomic layer etching
DRAEGER, NERISSA SUE, GOTTSCHO, RICHARD A, LILL, THORSTEN, FISCHER, ANDREAS, BERRY III, IVAN L
Year of Publication 01.08.2023
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Year of Publication 01.08.2023
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Predicting etch characteristics in thermal etching and atomic layer etching
DRAEGER, NERISSA SUE, GOTTSCHO, RICHARD A, LILL, THORSTEN, FISCHER, ANDREAS, BERRY III, IVAN L
Year of Publication 11.05.2023
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Year of Publication 11.05.2023
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Reflective fourier ptychography imaging of large surfaces
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Year of Publication 01.10.2021
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