System and method for automatically identifying defect-based test coverage gaps in semiconductor devices
RATHER ROBERT J, GRUSS TOBIAS, VON DEN HOFF MIKE, SAVILLE BRIAN, SHERMAN KAMRAN, DONZELLA OSVALDO, LIN XUANZHENG, LACH JOHANNES, NARASIMHAN NARASIMHAN, ROBINSON JOHN, PRICE DAVID W, LENOX CHRISTIAN
Year of Publication 11.08.2023
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Year of Publication 11.08.2023
Patent