System and method for weighting defects with co-located modeling flaws
RATHERT ROBERT J, LENNOX CHRISTOPHER V, PRICE DAVID W, DONZELLA, OLIVIER
Year of Publication 03.05.2024
Get full text
Year of Publication 03.05.2024
Patent
System and method for semiconductor defect guided presintering and system-level testing
RATHERT ROBERT J, LENNOX CHRISTOPHER V, ROBINSON JOHN, PRICE DAVID W, DONZELLA, OLIVIER
Year of Publication 20.10.2023
Get full text
Year of Publication 20.10.2023
Patent
System and method for evaluating reliability of semiconductor die package
RATHERT ROBERT J, LENNOX CHRISTOPHER V, PRICE DAVID W, DONZELLA, OLIVIER
Year of Publication 01.09.2023
Get full text
Year of Publication 01.09.2023
Patent
System for automatic diagnosis and monitoring of semiconductor defective die screening performance via correlation of defect and electrical test data
RATHERT ROBERT J, LENNOX CHRISTOPHER V, ROBINSON JOHN, PRICE DAVID W, LACH, J ¨ 1 RGEN, DONZELLA, OLIVIER
Year of Publication 14.05.2024
Get full text
Year of Publication 14.05.2024
Patent
Systems and methods for identifying potential reliability defects in semiconductor devices
RATHERT ROBERT J, LENNOX CHRISTOPHER V, KAPPEL ROBERT, SHERMAN KARA L, PRICE DAVID W, DONZELLA, OLIVIER
Year of Publication 19.08.2022
Get full text
Year of Publication 19.08.2022
Patent
Advanced on-line part averaging testing
RATHERT ROBERT J, SAVILLE BRADLEY, BHATTI, NINA, GRUSS THOMAS, LIM AMY, SHERMAN KARA L, KAPPEL ROBERT, ROBINSON, JOHN, C, VON DEN HOFF MARK, PRICE DAVID W, SUTHERLAND DAVID, DONZELLA, OLIVIER
Year of Publication 19.08.2022
Get full text
Year of Publication 19.08.2022
Patent