Search Results - "DOMINIC J BENVEGNU" :: K.UTB vyhledávací portál

FILM THICKNESS ESTIMATION FROM MACHINE LEARNING BASED PROCESSING OF SUBSTRATE IMAGES

by ALAHGHOLIPOUROMRANI, Arash, QIAN, Jun, SHRESTHA, Kiran Lall, DHANDAPANI, Sivakumar, BENVEGNU, Dominic J
Year of Publication 06.01.2022

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FILM THICKNESS ESTIMATION FROM MACHINE LEARNING BASED PROCESSING OF SUBSTRATE IMAGES

by Qian, Jun, Dhandapani, Sivakumar, Benvegnu, Dominic J, Shrestha, Kiran Lall, Alahgholipouromrani, Arash
Year of Publication 30.12.2021

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SYSTEM USING FILM THICKNESS ESTIMATION FROM MACHINE LEARNING BASED PROCESSING OF SUBSTRATE IMAGES

by Qian, Jun, Dhandapani, Sivakumar, Benvegnu, Dominic J, Shrestha, Kiran Lall, Alahgholipouromrani, Arash
Year of Publication 30.12.2021

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Polishing System with Capacitive Shear Sensor

by Wiswell, Nicholas, Benvegnu, Dominic J, Chou, Chih Chung
Year of Publication 05.03.2020

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POLISHING SYSTEM WITH CAPACITIVE SHEAR SENSOR

by CHOU, Chih Chung, WISWELL, Nicholas, BENVEGNU, Dominic J
Year of Publication 05.03.2020

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Thickness Measurement of Substrate Using Color Metrology

by Benvegnu, Dominic J, Swedek, Boguslaw A, Josefowicz, Martin A, Motamedi, Nojan
Year of Publication 18.11.2021

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Thickness measurement of substrate using color metrology

by Benvegnu, Dominic J, Swedek, Boguslaw A, Josefowicz, Martin A, Motamedi, Nojan
Year of Publication 24.08.2021

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ENDPOINTING DETECTION FOR CHEMICAL MECHANICAL POLISHING BASED ON SPECTROMETRY

by Benvegnu, Dominic J, David, Jeffrey Drue, Swedek, Boguslaw A
Year of Publication 15.08.2019

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Linear Prediction For Filtering Of Data During In-Situ Monitoring Of Polishing

by BENVEGNU DOMINIC J
Year of Publication 31.10.2013

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LINEAR PREDICTION FOR FILTERING OF DATA DURING IN-SITU MONITORING OF POLISHING

by BENVEGNU, DOMINIC, J
Year of Publication 31.10.2013

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THICKNESS MEASUREMENT OF SUBSTRATE USING COLOR METROLOGY

by BENVEGNU DOMINIC J
Year of Publication 03.05.2019

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Endpointing detection for chemical mechanical polishing based on spectrometry

by Benvegnu, Dominic J, David, Jeffrey Drue, Swedek, Boguslaw A
Year of Publication 30.04.2019

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Fourier filtering for measuring spectral data of layer thickness during substrate processing

by CHERIAN BENJAMIN, BENVEGNU DOMINIC J, LEE HARRY Q
Year of Publication 13.02.2024

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RESIDUE DETECTION USING A LUMINANCE HISTOGRAM

by BENVEGNU DOMINIC J, MOTAMEDI NOJAN
Year of Publication 18.09.2020

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Residue detection using a luminance histogram

by BENVEGNU, DOMINIC J, MOTAMEDI, NOJAN
Year of Publication 01.08.2020

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Thickness Measurement of Substrate Using Color Metrology

by Benvegnu, Dominic J, Swedek, Boguslaw A, Josefowicz, Martin A, Motamedi, Nojan
Year of Publication 13.08.2020

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THICKNESS MEASUREMENT OF SUBSTRATE USING COLOR METROLOGY

by MOTAMEDI, Nojan, SWEDEK, Boguslaw A, JOSEFOWICZ, Martin A, BENVEGNU, Dominic J
Year of Publication 13.08.2020

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Thickness measurement of substrate using color metrology

by SWEDEK BOGUSLAW A, BENVEGNU DOMINIC J
Year of Publication 19.10.2021

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Polishing pad, polishing system and manufacturing method of polishing pad

by SWEDEK BOGDAN,LISCHKA DAVID J.,DAVID JEFFREY DRUE,BENVEGNU DOMINIC J
Year of Publication 04.04.2007

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Thickness measurement of substrate using color metrology

by BENVEGNU, DOMINIC J
Year of Publication 01.06.2018

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