Study of In0.53Ga0.47As/In0.52Al0.48As quantum wells on InP by spectroscopic ellipsometry and photoluminescence
DINGES, H. W, HILLMER, H, BURKHARD, H, LÖSCH, R, NICKEL, H, SCHLAPP, W
Published in Surface science (20.04.1994)
Published in Surface science (20.04.1994)
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Conference Proceeding
Journal Article
Determination of ion beam etching damage on InP by spectroscopic ellipsometry
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Journal Article
Conference Proceeding
Refractive indices of InAlAs and InGaAs/InP from 250 to 1900 nm determined by spectroscopic ellipsometry
Dinges, H.W., Burkhard, H., Lösch, R., Nickel, H., Schlapp, W.
Published in Applied surface science (1992)
Published in Applied surface science (1992)
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Journal Article
Conference Proceeding
Spectroscopic ellipsometry : a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53AlxGa0.47-xAs on InP in the wavelength range from 280 to 1900 nm
DINGES, H. W, BURKHARD, H, LÖSCH, R, NICKEL, H, SCHLAPP, W
Published in Thin solid films (12.10.1993)
Published in Thin solid films (12.10.1993)
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Conference Proceeding
Journal Article
Determination of refractive indices of In0.53Al0.40Ga0.07As and In0.53Al0.11Ga0.36As on InP in the wavelength range from 280 to 1900 nm by spectroscopic ellipsometry
DINGES, H. W, BURKHARD, H, LÖSCH, R, NICKEL, H, SCHLAPP, W
Published in Applied surface science (02.03.1993)
Published in Applied surface science (02.03.1993)
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Conference Proceeding
Journal Article
Determination of the refractive index of In0.53Al0.11Ga0.36As on InP in the wavelength range from 280 to 1900 nm by spectroscopic ellipsometry
DINGES, H. W, BURKHARD, H, LÖSCH, R, NICKEL, H, SCHLAPP, W
Published in Applied surface science (02.05.1993)
Published in Applied surface science (02.05.1993)
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Conference Proceeding
Journal Article
Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In sub 0 sub . sub 5 sub 2 Al sub 0 sub . sub 4 sub 8 As and In sub 0 sub . sub 5 sub 3 Al sub x Ga sub 0 sub . sub 4 sub 7 sub - sub x As on InP in the wavelength range from 280 to 1900 nm
Dinges, H W, Burkhard, H, Losch, R, Nickel, Hubertus, Schlapp, W
Published in Thin solid films (01.01.1993)
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Published in Thin solid films (01.01.1993)
Journal Article
Determination of refractive indices of In sub(0.53)Al sub(0.40)Ga sub(0.07)As and In sub(0.53)Al sub(0.11)Ga sub(0.36)As on InP in the wavelength range from 280 to 1900 nm by spectroscopic ellipsometry
Dinges, H W, Burkhard, H, Losch, R, Nickel, H, Schlapp, W
Published in Applied surface science (01.01.1993)
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Published in Applied surface science (01.01.1993)
Journal Article