Raman study of the strain and H2 preconditioning effect on self-assembled Ge island on Si (001)
LU XU, MCNALLY, P. J, DILLIWAY, G. D. M, COWERN, N. E. B, JEYNES, Chris, MENDOZA, Ernest, ASHBURN, Peter, BAGNALL, Darren M
Published in Journal of materials science. Materials in electronics (01.07.2005)
Published in Journal of materials science. Materials in electronics (01.07.2005)
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Conference Proceeding
Journal Article
Self-assembled germanium islands grown on (001) silicon substrates by low-pressure chemical vapor deposition
DILLIWAY, G. D. M, BAGNALL, D. M, COWERN, N. E. B, JEYNES, C
Published in Journal of materials science. Materials in electronics (01.05.2003)
Published in Journal of materials science. Materials in electronics (01.05.2003)
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Conference Proceeding
Journal Article
Stress characterization of device layers and the underlying Si1-xGex virtual substrate with high-resolution micro-Raman spectroscopy
CHEN, W. M, MCNALLY, P. J, DILLIWAY, G. D. M, BONAR, J, TUOMI, T, WILLOUGHBY, A. F. W
Published in Journal of materials science. Materials in electronics (01.05.2003)
Published in Journal of materials science. Materials in electronics (01.05.2003)
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Conference Proceeding
Journal Article
Stress characterization of device layers and the underlying Si[1[-[xGe[x virtual substrate with high-resolution micro-Raman spectroscopy
Chen, W M, McNally, P J, Dilliway, G D M, Bonar, J, Tuomi, T, Willoughby, A F W
Published in Journal of materials science. Materials in electronics (01.05.2003)
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Published in Journal of materials science. Materials in electronics (01.05.2003)
Journal Article