Optical second harmonic generation from silicon (100) crystals with process tailored surface and embedded silver nanostructures for silicon nonlinear nanophotonics
Bhowmik, Gourav, An, Yong Q., Schujman, Sandra, Diebold, Alain C., Huang, Mengbing
Published in Journal of applied physics (28.10.2020)
Published in Journal of applied physics (28.10.2020)
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Journal Article
Structural Correlation of Ferroelectric Behavior in Mixed Hafnia-Zirconia High-k Dielectrics for FeRAM and NCFET Applications
Mukundan, Vineetha, Beckmann, Karsten, Tapily, Kandabara, Consiglio, Steven, Clark, Robert, Leusink, Gert, Cady, Nathaniel, Diebold, Alain C.
Published in MRS advances (01.01.2019)
Published in MRS advances (01.01.2019)
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Journal Article
Electronic Excitations in Graphene in the 1–50 eV Range: The π and π + σ Peaks Are Not Plasmons
Nelson, Florence J, Idrobo, Juan-Carlos, Fite, John D, Mišković, Zoran L, Pennycook, Stephen J, Pantelides, Sokrates T, Lee, Ji Ung, Diebold, Alain C
Published in Nano letters (09.07.2014)
Published in Nano letters (09.07.2014)
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Journal Article
Role of Ge and Si substrates in higher-k tetragonal phase formation and interfacial properties in cyclical atomic layer deposition-anneal Hf1−xZrxO2/Al2O3 thin film stacks
Dey, Sonal, Tapily, Kandabara, Consiglio, Steven, Clark, Robert D., Wajda, Cory S., Leusink, Gert J., Woll, Arthur R., Diebold, Alain C.
Published in Journal of applied physics (28.09.2016)
Published in Journal of applied physics (28.09.2016)
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Journal Article
Enhancing one dimensional sensitivity with plasmonic coupling
O'Mullane, Samuel, Peterson, Brennan, Race, Joseph, Keller, Nick, Diebold, Alain C
Published in Optics express (20.10.2014)
Published in Optics express (20.10.2014)
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Journal Article
Effects of stress on the dielectric function of strained pseudomorphic Si1−xGex alloys from 0 to 75% Ge grown on Si (001)
Raja Muthinti, Gangadhara, Medikonda, Manasa, Adam, Thomas, Reznicek, Alexander, Diebold, Alain C.
Published in Journal of applied physics (01.09.2012)
Published in Journal of applied physics (01.09.2012)
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Journal Article
Subsurface Imaging with Scanning Ultrasound Holography
Diebold, Alain C.
Published in Science (American Association for the Advancement of Science) (07.10.2005)
Published in Science (American Association for the Advancement of Science) (07.10.2005)
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Journal Article
Spectroscopic ellipsometry characterization of high-k gate stacks with Vt shift layers
Di, Ming, Bersch, Eric, Clark, Robert, Consiglio, Steven, Leusink, Gert, Diebold, Alain C.
Published in Thin solid films (28.02.2011)
Published in Thin solid films (28.02.2011)
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Journal Article
Conference Proceeding
Fabrication of 5-20 nm thick β -W films
Narasimham, Avyaya J., Medikonda, Manasa, Matsubayashi, Akitomo, Khare, Prasanna, Chong, Hyuncher, Matyi, Richard J., Diebold, Alain, LaBella, Vincent P.
Published in AIP advances (01.11.2014)
Published in AIP advances (01.11.2014)
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Journal Article
Investigation of optical properties of benzocyclobutene wafer bonding layer used for 3D interconnects via infrared spectroscopic ellipsometry
Kamineni, Vimal K., Singh, Pratibha, Kong, LayWai, Hudnall, John, Qureshi, Jamal, Taylor, Chris, Rudack, Andy, Arkalgud, Sitaram, Diebold, Alain C.
Published in Thin solid films (28.02.2011)
Published in Thin solid films (28.02.2011)
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Journal Article
Conference Proceeding
Rapid optical determination of topological insulator nanoplate thickness and oxidation
Yang, Fan, Sendova, Mariana, Jacobs-Gedrim, Robin B., Song, Eui Sang, Green, Avery, Thiesen, Peter, Diebold, Alain, Yu, Bin
Published in AIP advances (01.01.2017)
Published in AIP advances (01.01.2017)
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Journal Article
Extension of Far UV spectroscopic ellipsometry studies of High-κ dielectric films to 130 nm
KAMINENI, Vimal K, HILFIKER, James N, FREEOUF, John L, CONSIGLIO, Steve, CLARK, Robert, LEUSINK, Gert J, DIEBOLD, Alain C
Published in Thin solid films (28.02.2011)
Published in Thin solid films (28.02.2011)
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Conference Proceeding
Journal Article
Graphene metrology and devices
Diebold, Alain C., Nelson, Florence
Published in International journal of materials research (01.02.2010)
Published in International journal of materials research (01.02.2010)
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Journal Article