Automatic Verification of Mixed-Signal ATE Test Programs using Device Variation
Mayer, Franziska, Schott, Christian, Billich, Enrico, Yazdani, Saeid, Heinkel, Ulrich, Daler, Georg, Ruf, Bernhard, Pannuzzo, Ricardo, Dickenscheid, Wolfgang
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Get full text
Conference Proceeding
Device and Method for Stopping an Etching Process
DICKENSCHEID WOLFGANG, MEINHOLD DIRK, HARTENBERGER MICHAEL, SEIDEMANN GEORG, BRENCHER LOTHAR
Year of Publication 07.07.2016
Get full text
Year of Publication 07.07.2016
Patent
Device and method for stopping etching process
DICKENSCHEID WOLFGANG, MEINHOLD DIRK, HARTENBERGER MICHAEL, SEIDEMANN GEORG, BRENCHER LOTHAR
Year of Publication 05.04.2016
Get full text
Year of Publication 05.04.2016
Patent
Device and Method for Stopping Etching Process
DICKENSCHEID WOLFGANG, MEINHOLD DIRK, HARTENBERGER MICHAEL, SEIDEMANN GEORG, BRENCHER LOTHAR
Year of Publication 31.10.2013
Get full text
Year of Publication 31.10.2013
Patent
Verfahren zur Herstellung eines Halbleiterbauelements
DICKENSCHEID, WOLFGANG, POWER, JOHN, SHUM, DANNY PAKUM, STRENZ, ROBERT
Year of Publication 28.04.2011
Get full text
Year of Publication 28.04.2011
Patent