Electrostatic pick-and-place micro/nanomanipulation under the electron beam
Denisyuk, Andrey I., Komissarenko, Filipp E., Mukhin, Ivan S.
Published in Microelectronic engineering (01.06.2014)
Published in Microelectronic engineering (01.06.2014)
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Journal Article
Demonstration of unusual nanoantenna array modes through direct reconstruction of the near-field signal
Sinev, Ivan S, Voroshilov, Pavel M, Mukhin, Ivan S, Denisyuk, Andrey I, Guzhva, Mikhail E, Samusev, Anton K, Belov, Pavel A, Simovski, Constantin R
Published in Nanoscale (14.01.2015)
Published in Nanoscale (14.01.2015)
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Journal Article
Towards Femtojoule Nanoparticle Phase-Change Memory
Denisyuk, Andrey I., MacDonald, Kevin F., Abajo, F. Javier García de, Zheludev, Nikolay I.
Published in Japanese Journal of Applied Physics (01.03.2009)
Published in Japanese Journal of Applied Physics (01.03.2009)
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Journal Article
Xe plasma FIB Delayering of IC based on 14 nm node technology
Oboňa, Jozef Vincenc, Hrnčíř, Tomáš, Sharang, Šikula, Marek, Denisyuk, Andrey
Published in Microscopy and microanalysis (01.07.2016)
Published in Microscopy and microanalysis (01.07.2016)
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Journal Article
Curtaining-Free Top-Down TEM Lamella Preparation from a Cutting Edge Integrated Circuit
Denisyuk, Andrey, Hrnčíř, Tomáš, Oboňa, Jozef Vincenc, Petrenec, Martin, Jan Michalička
Published in Microscopy and microanalysis (01.07.2016)
Published in Microscopy and microanalysis (01.07.2016)
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Journal Article
In-depth Analysis of 10 nm Exynos Processor using Micro CT and FIB-SEM System
Sharang, S, Dluhos, Jiri, Kalasova, Dominika, Denisyuk, Andrey, Vana, Rostislav, Zikmund, Tomas, Kaiser, Jozef, Obona, Jozef Vincenc
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
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Conference Proceeding