Characterization and modeling of electrical stress degradation in STI-based integrated power devices
Reggiani, Susanna, Barone, Gaetano, Gnani, Elena, Gnudi, Antonio, Baccarani, Giorgio, Poli, Stefano, Wise, Rick, Chuang, Ming-Yeh, Tian, Weidong, Pendharkar, Sameer, Denison, Marie
Published in Solid-state electronics (01.12.2014)
Published in Solid-state electronics (01.12.2014)
Get full text
Journal Article
Predictors of chronic pain and level of physical function in total knee arthroplasty: a protocol for a systematic review and meta-analysis
Olsen, Unni, Lindberg, Maren Falch, Denison, Eva Marie-Louise, Rose, Christopher James, Gay, Caryl Lynn, Aamodt, Arild, Brox, Jens Ivar, Skare, Øystein, Furnes, Ove, Lee, Kathryn A, Lerdal, Anners
Published in BMJ open (10.09.2020)
Published in BMJ open (10.09.2020)
Get full text
Journal Article
Physics-Based Analytical Model for HCS Degradation in STI-LDMOS Transistors
Reggiani, S., Poli, S., Denison, M., Gnani, E., Gnudi, A., Baccarani, G., Pendharkar, S., Wise, R.
Published in IEEE transactions on electron devices (01.09.2011)
Published in IEEE transactions on electron devices (01.09.2011)
Get full text
Journal Article
Analysis of HCS in STI-based LDMOS transistors
Reggiani, S, Poli, S, Gnani, E, Gnudi, A, Baccarani, G, Denison, M, Pendharkar, S, Wise, R, Seetharaman, S
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Get full text
Conference Proceeding
Reliability of High-Voltage Molding Compounds: Particle Size, Curing Time, Sample Thickness, and Voltage Impact on Polarization
Garcia, Andres, Warner, Nathan, D'Souza, Nandika Anne, Tuncer, Enis, Luu Nguyen, Denison, Marie, Fong, Jeffrey T.
Published in IEEE transactions on industrial electronics (1982) (01.11.2016)
Published in IEEE transactions on industrial electronics (1982) (01.11.2016)
Get full text
Journal Article
Explanation of the Rugged LDMOS Behavior by Means of Numerical Analysis
Reggiani, S., Baccarani, G., Gnani, E., Gnudi, A., Denison, M., Pendharkar, S., Wise, R., Seetharaman, S.
Published in IEEE transactions on electron devices (01.11.2009)
Published in IEEE transactions on electron devices (01.11.2009)
Get full text
Journal Article
Optimization and Analysis of the Dual n/p-LDMOS Device
Poli, S., Reggiani, S., Sharma, R. K., Denison, M., Gnani, E., Gnudi, A., Baccarani, G.
Published in IEEE transactions on electron devices (01.03.2012)
Published in IEEE transactions on electron devices (01.03.2012)
Get full text
Journal Article
Temperature Dependence of the Threshold Voltage Shift Induced by Carrier Injection in Integrated STI-Based LDMOS Transistors
Poli, S, Reggiani, S, Denison, M, Gnani, E, Gnudi, A, Baccarani, G, Pendharkar, S, Wise, R
Published in IEEE electron device letters (01.06.2011)
Published in IEEE electron device letters (01.06.2011)
Get full text
Journal Article
Modeling and characterization of hot-carrier stress degradation in power MOSFETs
Reggiani, Susanna, Gnani, Elena, Gnudi, Antonio, Baccarani, Giorgio, Poli, Stefano, Chuang, Ming-Yeh, Weidong Tian, Denison, Marie
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)
Get full text
Conference Proceeding
Journal Article
Key Technologies for System-Integration in the Automotive and IndustrialApplications
Stecher, Matthias, Jensen, Nils, Denison, Marie, Rudolf, Ralf
Published in IEEE transactions on power electronics (01.05.2005)
Published in IEEE transactions on power electronics (01.05.2005)
Get full text
Journal Article
Factors correlated with pain after total knee arthroplasty: A systematic review and meta-analysis
Olsen, Unni, Lindberg, Maren Falch, Rose, Christopher, Denison, Eva, Gay, Caryl, Aamodt, Arild, Brox, Jens Ivar, Skare, Øystein, Furnes, Ove, Lee, Kathryn A, Lerdal, Anners
Published in PloS one (24.03.2023)
Published in PloS one (24.03.2023)
Get full text
Journal Article
Measurement and modeling of the electron impact-ionization coefficient in silicon up to very high temperatures
Reggiani, S., Jensen, N., Groos, G., Stecher, M., Gnani, E., Rudan, M., Baccarani, G., Corvasce, C., Barlini, D., Ciappa, M., Fichtner, W., Denison, M.
Published in IEEE transactions on electron devices (01.10.2005)
Published in IEEE transactions on electron devices (01.10.2005)
Get full text
Journal Article
Investigation of a dual channel N/P-LDMOS and application to LDO linear voltage regulation
Denison, M, Yizhong Xie, Estl, H
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)
Get full text
Conference Proceeding
Key technologies for system-integration in the automotive and Industrial Applications
Stecher, M., Jensen, N., Denison, M., Rudolf, R., Strzalkoswi, B., Muenzer, M.N., Lorenz, L.
Published in IEEE transactions on power electronics (01.05.2005)
Published in IEEE transactions on power electronics (01.05.2005)
Get full text
Journal Article
Moving current filaments in integrated DMOS transistors under short-duration current stress
Denison, M., Blaho, M., Rodin, P., Dubec, V., Pogany, D., Silber, D., Gornik, E., Stecher, M.
Published in IEEE transactions on electron devices (01.10.2004)
Published in IEEE transactions on electron devices (01.10.2004)
Get full text
Journal Article
Moving current filaments in integrated DMOS transistors under short-duration current stress
Denison, M., Blaho, M., Rodin, P., Dubec, V., Pogany, D., Silber, D., Gornik, E., Stecher, M.
Published in IEEE transactions on electron devices (01.08.2004)
Published in IEEE transactions on electron devices (01.08.2004)
Get full text
Journal Article