A cryogenic, coincident fluorescence, electron, and ion beam microscope
Boltje, Daan B, Hoogenboom, Jacob P, Jakobi, Arjen J, Jensen, Grant J, Jonker, Caspar T H, Kaag, Max J, Koster, Abraham J, Last, Mart G F, de Agrela Pinto, Cecilia, Plitzko, Jürgen M, Raunser, Stefan, Tacke, Sebastian, Wang, Zhexin, van der Wee, Ernest B, Wepf, Roger, den Hoedt, Sander
Published in eLife (28.10.2022)
Published in eLife (28.10.2022)
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Journal Article
Fluorescence-guided lamella fabrication with ENZEL, an integrated cryogenic CLEM solution for the cryo-electron tomography workflow
Jonker, Caspar, Boltje, Daan, Hoogenboom, Jacob, Jakobi, Arjen, Jensen, Grant, Koster, Abraham, Last, Mart, Plitzko, Jürgen, Raunser, Stefan, Tacke, Sebastian, Wepf, Roger, Hoedt, Sander Den
Published in Microscopy and microanalysis (01.08.2021)
Published in Microscopy and microanalysis (01.08.2021)
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Journal Article
ENZEL - A cryogenic, retrofittable, coincident fluorescence, electron, and ion beam solution for the cryo-electron tomography workflow
Boltje, Daan, Hoogenboom, Jacob, Jakobi, Arjen, Jensen, Grant, Jonker, Caspar, Koster, Abraham, Last, Mart, Plitzko, Jürgen, Raunser, Stefan, Tacke, Sebastian, Wepf, Roger, Hoedt, Sander Den
Published in Microscopy and microanalysis (01.08.2021)
Published in Microscopy and microanalysis (01.08.2021)
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Journal Article
A Cryogenic Fluorescence Microscope Retrofittable in Coincidence with a FIB/SEM
Boltje, Daan B., Hoogenboom, Jacob P., Jakobi, Arjen J., Jensen, Grant J., Jonker, Caspar T.H., Koster, Abraham J., Last, Mart G.F., Plitzko, Jürgen M., Raunser, Stefan, Tacke, Sebastian, Wepf, Roger, den Hoedt, Sander
Published in Microscopy and microanalysis (01.08.2022)
Published in Microscopy and microanalysis (01.08.2022)
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Journal Article
METHOD FOR RECORDING AND CORRELATING LIGHT AND CHARGED PARTICLE MICROSCOPY IMAGES
DEN HOEDT, Sander, SRINIVASA RAJA, Aditi, LANE, Ryan Irwin, HOOGENBOOM, Jacob Pieter
Year of Publication 14.12.2022
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Year of Publication 14.12.2022
Patent
Method for recording and correlating light and charged particle microscopy images
RYAN IRWIN LANE, JACOB PIETER HOOGENBOOM, ADITI SRINIVASA RAJA, SANDER DEN HOEDT
Year of Publication 13.09.2021
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Year of Publication 13.09.2021
Patent