by Hao Yu, Schaekers, Marc, Schram, Tom, Rosseel, Erik, Martens, Koen, Demuynck, Steven, Horiguchi, Naoto, Barla, Kathy, Collaert, Nadine, De Meyer, Kristin, Thean, Aaron
Published in IEEE electron device letters (01.06.2015)

by Hao Yu, Schaekers, Marc, Schram, Tom, Demuynck, Steven, Horiguchi, Naoto, Barla, Kathy, Collaert, Nadine, Thean, Aaron Voon-Yew, De Meyer, Kristin
Published in IEEE transactions on electron devices (01.07.2016)

by Litta, Eugenio Dentoni, Ritzenthaler, Romain, Schram, Tom, Spessot, Alessio, O Sullivan, Barry, Machkaoutsan, Vladimir, Fazan, Pierre, Ji, Yunhyuck, Mannaert, Geert, Lorant, Christophe, Sebaai, Farid, Thiam, Arame, Ercken, Monique, Demuynck, Steven, Horiguchi, Naoto
Published in Japanese Journal of Applied Physics (01.04.2018)

by Demuynck, Steven, Huffman, Craig, Claes, Martine, Suhard, Samuel, Versluijs, Janko, Volders, Henny, Heylen, Nancy, Kellens, Kristof, Croes, Kristof, Struyf, Herbert, Vereecke, Guy, Verdonck, Patrick, Roest, David De, Beynet, Julien, Sprey, Hessel, Beyer, Gerald P.
Published in Japanese Journal of Applied Physics (01.04.2010)

by Demuynck, S., Kim, H., Huffman, C., Darnon, Maxime, .Struyf, H., Versluijs, J., Claes, M., Vereecke, G., Verdonck, P., Volders, H., Heylen, N., Kellens, K., de Roest, D., Sprey, H., Beyer, G.
Published in Japanese Journal of Applied Physics (01.04.2009)

by Demuynck, Steven, Kim, Honggun, Huffman, Craig, Darnon, Maxime, Struyf, Herbert, Versluijs, Janko, Claes, Martine, Vereecke, Guy, Verdonck, Patrick, Volders, Henny, Heylen, Nancy, Kellens, Kristof, Roest, David De, Sprey, Hessel, Beyer, Gerald
Published in Japanese Journal of Applied Physics (01.04.2009)

by Roest, David De, Vereecke, Bart, Huffman, Craig, Heylen, Nancy, Croes, Kristof, Arai, Hirofumi, Takamure, Noboru, Beynet, Julien, Sprey, Hessel, Matsushita, Kiyohiro, Kobayashi, Nobuyoshi, Verdonck, Patrick, Demuynck, Steven, Beyer, Gerald, Tokei, Zsolt, Struyf, Herbert
Published in Japanese Journal of Applied Physics (01.05.2010)

by Vincent, Benjamin, Hathwar, Raghu, Kamon, Mattan, Ervin, Joseph, Schram, Tom, Chiarella, Thomas, Demuynck, Steven, Baudot, Sylvain, Siew, Yong Kong, Kubicek, Stenfan, Litta, Eugenio Dentoni, Chew, SoonAik, Mitard, Jerome
Published in IEEE transactions on electron devices (01.12.2020)

by Rosseel, Erik, Porret, Clement, Dursap, Thomas, Loo, Roger, Mertens, Hans, Ganguly, Jishnu, Sarkar, Ritam, Cavalcante, Camila, Richard, Olivier, Geypen, Jef, Marozas, Brendan, Casey, Daniel, Khazaka, Rami, Demuynck, Steven, P. B. Lima, Lucas, Langer, Robert, Biesemans, Serge, Horiguchi, Naoto
Published in ECS transactions (27.09.2024)

by Gupta, Anshul, Pedreira, Olalla Varela, Arutchelvan, Goutham, Zahedmanesh, Houman, Devriendt, Katia, Mertens, Hans, Tao, Zheng, Ritzenthaler, Romain, Wang, Shouhua, Radisic, Dunja, Kenis, Karine, Teugels, Lieve, Sebai, Farid, Lorant, Christophe, Jourdan, Nicolas, Chan, Boon Teik, Subramanian, Sujith, Schleicher, Filip, Hopf, Toby, Peter, Antony Premkumar, Rassoul, Nouredine, Debruyn, Haroen, Demonie, Ingrid, Siew, Yong Kong, Chiarella, Thomas, Briggs, Basoene, Zhou, Xiuju, Rosseel, Erik, De Keersgieter, An, Capogreco, Elena, Litta, Eugenio Dentoni, Boccardi, Guillaume, Baudot, Sylvain, Mannaert, Geert, Bontemps, Noemie, Sepulveda, A., Mertens, Sofie, Kim, Min-Soo, Dupuy, Emmanuel, Vandersmissen, Kevin, Paolillo, Sara, Yakimets, Dmitry, Chehab, Bilal, Favia, Paola, Drijbooms, Christel, Cousserier, Joris, Jaysankar, Manoj, Lazzarino, Frederic, Morin, Pierre, Altamirano, Efrain, Mitard, Jerome, Wilson, Christopher J., Holsteyns, Frank, Boemmels, Juergen, Demuynck, Steven, Tokei, Zsolt, Horiguchi, Naoto
Published in IEEE transactions on electron devices (01.12.2020)

by Hao Yu, Schaekers, Marc, Demuynck, Steven, Barla, Kathy, Mocuta, Anda, Horiguchi, Naoto, Collaert, Nadine, Thean, Aaron Voon-Yew, De Meyer, Kristin
Published in 2016 16th International Workshop on Junction Technology (IWJT) (01.05.2016)

by Roussel, Philippe J., Chasin, Adrian, Demuynck, Steven, Horiguchi, Naoto, Linten, Dimitri, Mocuta, Anda
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)

by Yu, Hao, Schaekers, Marc, Schram, Tom, Demuynck, Steven, Horiguchi, Naoto, Barla, Kathy, Collaert, Nadine, Thean, Aaron Voon-Yew, De Meyer, Kristin
Published in IEEE transactions on electron devices (01.07.2016)

by Yu, Hao, Schaekers, Marc, Schram, Tom, Demuynck, Steven, Horiguchi, Naoto, Barla, Kathy, Collaert, Nadine, Thean, Aaron Voon-Yew, De Meyer, Kristin
Published in IEEE transactions on electron devices (01.07.2016)

by Parihar, Narendra, Arutchelvan, Goutham, Franco, Jacopo, Baudot, Sylvain, Opedebeeck, Ann, Demuynck, Steven, Arimura, Hiroaki, Ragnarsson, Lars-Ake, Mitard, Jerome, De Heyn, Vincent, Mercha, Abdelkarim
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)

by Hao Yu, Schaekers, Marc, Peter, Anthony, Pourtois, Geoffrey, Rosseel, Erik, Joon-Gon Lee, Woo-Bin Song, Keo Myoung Shin, Everaert, Jean-Luc, Soon Aik Chew, Demuynck, Steven, Daeyong Kim, Barla, Kathy, Mocuta, Anda, Horiguchi, Naoto, Thean, Aaron Voon-Yew, Collaert, Nadine, De Meyer, Kristin
Published in IEEE transactions on electron devices (01.12.2016)

by Croes, Kristof, Demuynck, Steven, Siew, Yong, Pantouvaki, Marianna, Wilson, Christopher, Heylen, Nancy, Beyer, Gerald, TAkei, Zsolt
Published in Microelectronic engineering (01.06.2013)

by Croes, Kristof, Demuynck, Steven, Siew, Yong Kong, Pantouvaki, Marianna, Wilson, Christopher J., Heylen, Nancy, Beyer, Gerald P., Tőkei, Zsolt
Published in Microelectronic engineering (01.06.2013)

by Mertens, Hans, Ritzenthaler, Romain, Hikavyy, Andriy Yakovitch, Kim, Min-Soo, Tao, Zheng, Wostyn, Kurt, Schram, Tom, Kunnen, Eddy, Ragnarsson, Lars-Åke, Dekkers, Harold F. W., Hopf, Toby, Devriendt, Katia, Tsvetanova, Diana, Chew, Soon Aik, Kikuchi, Yoshiaki, Van Besien, Els, Rosseel, Erik, Mannaert, Geert, De Keersgieter, An, Chasin, Adrian, Kubicek, Stefan, Dangol, Anish, Demuynck, Steven, Barla, Kathy, Mocuta, Dan, Horiguchi, Naoto
Published in ECS transactions (26.04.2017)

by Kauerauf, T., Branka, A., Sorrentino, G., Roussel, P., Demuynck, S., Croes, K., Mercha, K., Bommels, J., Tokei, Z., Groeseneken, G.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)