III–V compound semiconductor transistors—from planar to nanowire structures
Riel, Heike, Wernersson, Lars-Erik, Hong, Minghwei, del Alamo, Jesús A.
Published in MRS bulletin (01.08.2014)
Published in MRS bulletin (01.08.2014)
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Journal Article
On the Imprint Mechanism of Thin-Film Hf₀.₅Zr₀.₅O₂ Ferroelectrics
Kim, Taekyong, Alamo, Jesus A. del, Antoniadis, Dimitri
Published in IEEE transactions on electron devices (01.11.2024)
Published in IEEE transactions on electron devices (01.11.2024)
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Journal Article
Refractory W Ohmic Contacts to H-Terminated Diamond
Vardi, Alon, Tordjman, Moshe, Kalish, Rafi, del Alamo, Jesus A.
Published in IEEE transactions on electron devices (01.09.2020)
Published in IEEE transactions on electron devices (01.09.2020)
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Journal Article
A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs
Wenjie Lu, Guo, Alex, Vardi, Alon, del Alamo, Jesus A.
Published in IEEE electron device letters (01.02.2014)
Published in IEEE electron device letters (01.02.2014)
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Journal Article
A model for the critical voltage for electrical degradation of GaN high electron mobility transistors
Joh, Jungwoo, Gao, Feng, Palacios, Tomás, del Alamo, Jesús A.
Published in Microelectronics and reliability (01.06.2010)
Published in Microelectronics and reliability (01.06.2010)
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Journal Article
Conference Proceeding
Impact of high-power stress on dynamic ON-resistance of high-voltage GaN HEMTs
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Journal Article
Conference Proceeding
Activation energy of drain-current degradation in GaN HEMTs under high-power DC stress
Wu, Yufei, Chen, Chia-Yu, del Alamo, Jesús A.
Published in Microelectronics and reliability (01.12.2014)
Published in Microelectronics and reliability (01.12.2014)
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Journal Article
Conference Proceeding
WO3 Passivation of Access Regions in Diamond MOSFETs
Vardi, Alon, Tordjman, Moshe, Kalish, Rafi, Alamo, Jesus A. del
Published in IEEE transactions on electron devices (01.06.2022)
Published in IEEE transactions on electron devices (01.06.2022)
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Journal Article