by Palau Daval, N., Gardette, V., Joly, P.
Published in Journal of zoology (1987) (01.11.2018)

by Schwarzenbach, W., Daval, N., Maleville, C., Nguyen, B.-Y., Ecarnot, L., Loubriat, S., Detard, M., Cela, E., Bertrand-Giuliani, C., Chabanne, G., Maddalon, C.
Published in IEEE journal of the Electron Devices Society (2019)

by Liu, W.K., Lubyshev, D., Fastenau, J.M., Wu, Y., Bulsara, M.T., Fitzgerald, E.A., Urteaga, M., Ha, W., Bergman, J., Brar, B., Hoke, W.E., LaRoche, J.R., Herrick, K.J., Kazior, T.E., Clark, D., Smith, D., Thompson, R.F., Drazek, C., Daval, N.
Published in Journal of crystal growth (15.03.2009)

by Schwarzenbach, W., Rouchier, S., Berre, G., Boulet, R., Ledoux, O., Cela, E., Drouin, A., Chapelle, A., Monnoye, S., Biard, H., Alassaad, K., Viravaux, L., Mohamed, N. Ben, Radisson, D., Picun, G., Lavaitte, G., Bouville-Lallart, A., Roi, J., Widiez, J., Abadie, K., Rolland, E., Fournel, F., Gelineau, G., Mazen, F., Moulin, A., Moulin, C., Delprat, D., Daval, N., Odoul, S., Sandri, P., Maleville, C.
Published in 2022 International Conference on IC Design and Technology (ICICDT) (21.09.2022)

by Bedell, S.W., Daval, N., Khakifirooz, A., Kulkarni, P., Fogel, K., Domenicucci, A., Sadana, D.K.
Published in Microelectronic engineering (01.04.2011)

by Khakifirooz, A., Cheng, K., Nagumo, T., Loubet, N., Adam, T., Reznicek, A., Kuss, J., Shahrjerdi, D., Sreenivasan, R., Ponoth, S., He, H., Kulkarni, P., Liu, Q., Hashemi, P., Khare, P., Luning, S., Mehta, S., Gimbert, J., Zhu, Y., Zhu, Z., Li, J., Madan, A., Levin, T., Monsieur, F., Yamamoto, T., Naczas, S., Schmitz, S., Holmes, S., Aulnette, C., Daval, N., Schwarzenbach, W., Nguyen, B.-Y, Paruchuri, V., Khare, M., Shahidi, G., Doris, B.
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)

by Le Royer, C., Cassé, M., Cooper, D., Andrieu, F., Weber, O., Brevard, L., Perreau, P., Damlencourt, J.-F., Baudot, S., Prévitali, B., Tabone, C., Allain, F., Scheiblin, P., Rauer, C., Figuet, C., Aulnette, C., Daval, N., Nguyen, B.-Y., Bourdelle, K.K., Gyani, J., Valenza, M.
Published in Solid-state electronics (01.11.2011)

by Fitzgerald, Eugene A., Bulsara, M. T., Bai, Y., Cheng, C., Liu, W. K., Lubyshev, D., Fastenau, J. M., Wu, Y., Urtega, M., Ha, W., Bergman, J., Brar, B., Drazek, C., Daval, N, Leterte, F., Hoke, W. E., LaRoche, J. R., Herrick, Katherine J., Kazior, T. E.
Published in ECS transactions (2009)

by Herrick, Katherine J., Kazior, T. E., LaRoche, J. R., Liu, A W., Lubyshev, D., Fastenau, J. M., Urteaga, M., Ha, W., Bergman, J., Brar, B., Bulsara, M. T., Fitzgerald, Eugene A., Clark, D., Smith, D, Thompson, R. F., Daval, N, Celler, George K.
Published in ECS transactions (2009)

by Le Royer, C, Casse, M, Andrieu, F, Weber, O, Brevard, L, Perreau, P, Damlencourt, J, Baudot, S, Tabone, C, Allain, F, Scheiblin, P, Rauer, C, Hutin, L, Figuet, C, Aulnette, C, Daval, N, Nguyen, B, Bourdelle, K K
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)

by Schwarzenbach, W, Cauchy, X, Bonnin, O, Boedt, F, Butaud, E, Moulin, C, Kerdiles, S, Gilbert, J.-F, Daval, N, Aulnette, C, Girard, C, Yoshimi, M, Maleville, C
Published in 2010 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2010)

by MORICEAU, H, FOURNEL, F, SOUBIE, A, BIASSE, B, SOUSBIE, N, SARTORI, S, MICHAUD, J. F, LETERTRE, F, RAYSSAC, O, CAYREFOURCQ, I, RICHTARCH, C, DAVAL, N, ASPAR, B, AULNETTE, C, AKATSU, T, OSTERNAUD, B, GHYSELEN, B, MAZURE, C, BATAILLOU, B, BEAUMONT, A, MORALES, C, CARTIER, A. M, POCAS, S, LAGAHE, C, JALAGUIER, E
Published in Journal of electronic materials (01.08.2003)

by Paillard, V, Ghyselen, B, Aulnette, C, Osternaud, B, Daval, N, Fournel, F, Moriceau, H, Ernst, T, Hartmann, J.M, Lagahe-Blanchard, C, Pocas, S, Leduc, P, Vincent, L, Cristiano, F, Campidelli, Y, Kermarrec, O, Besson, P, Morand, Y
Published in Microelectronic engineering (01.04.2004)

by Weber, O., Faynot, O., Andrieu, F., Buj-Dufournet, C., Allain, F., Scheiblin, P., Foucher, J., Daval, N., Lafond, D., Tosti, L., Brevard, L., Rozeau, O., Fenouillet-Beranger, C., Marin, M., Boeuf, F., Delprat, D., Bourdelle, K., Nguyen, B.-Y., Deleonibus, S.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)

by Bin Liu, Xiao Gong, Chunlei Zhan, Genquan Han, Hock-Chun Chin, Moh-Lung Ling, Jie Li, Yongdong Liu, Jiangtao Hu, Daval, N., Veytizou, C., Delprat, D., Bich-Yen Nguyen, Yee-Chia Yeo
Published in IEEE transactions on electron devices (01.06.2013)

by Bin Liu, Chunlei Zhan, Yue Yang, Ran Cheng, Pengfei Guo, Qian Zhou, Kong, E. Y.-J, Daval, N., Veytizou, C., Delprat, D., Bich-Yen Nguyen, Yee-Chia Yeo
Published in IEEE transactions on electron devices (01.07.2013)

by Garros, X., Rochette, F., Andrieu, F., Baudot, S., Reimbold, G., Aulnette, C., Daval, N., Boulanger, F.
Published in Journal of applied physics (01.06.2009)

by Bin Liu, Xiao Gong, Genquan Han, Lim, P. S. Y., Yi Tong, Qian Zhou, Yue Yang, Daval, N., Veytizou, C., Delprat, D., Bich-Yen Nguyen, Yee-Chia Yeo
Published in IEEE electron device letters (01.10.2012)

by Schwarzenbach, Walter, Daval, Nicolas, Barec, Vincent, Bonnin, Olivier, Acosta-Alba, Pablo-Eduardo, Maddalon, Catherine, Chibko, Alexandre, Robson, Timothy, Nguyen, Bich-Yen, Maleville, Christophe
Published in ECS transactions (03.05.2013)

by Bonnin, Olivier, Schwarzenbach, Walter, Barec, V., Daval, Nicolas, Cauchy, X., Nguyen, By, Maleville, C.
Published in ECS transactions (15.03.2013)