Closing the gap between n‐ and p‐type silicon heterojunction solar cells: 24.47% efficiency on lightly doped Ga wafers
Danel, Adrien, Chaugier, Nicolas, Veirman, Jordi, Varache, Renaud, Albaric, Mickael, Pihan, Etienne
Published in Progress in photovoltaics (01.12.2023)
Published in Progress in photovoltaics (01.12.2023)
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Journal Article
Investigation of p-Type Silicon Heterojunction Radiation Hardness
Cariou, Romain, Danel, Adrien, Enjalbert, Nicolas, Jay, Frederic, Dubois, Sebastien
Published in IEEE journal of photovoltaics (01.01.2024)
Published in IEEE journal of photovoltaics (01.01.2024)
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Journal Article
Investigation of P-Type Silicon Heterojunction Radiation Hardness
Cariou, Romain, Danel, Adrien, Enjalbert, Nicolas, Jay, Frederic, Dubois, Sebastien
Published in 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC) (11.06.2023)
Published in 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC) (11.06.2023)
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Conference Proceeding
Initial Results of Enel Green Power Silicon Heterojunction Factory and Strategies for Improvements
Condorelli, Giuseppe, Favre, Wilfried, Sciuto, Marcello, Ragonesi, Antonino, Rotoli, Pietro, Di Matteo, Alfredo, Nicotra, Domenico, Rametta, Francesco, Iuvara, Dario, Foti, Marina, Danel, Adrien, Sicot, Lionel, Bath, Vincent, Derrier, Aude, Veschetti, Yannick, Roux, Charles, Ribeyron, Pierre-Jean, Gerardi, Cosimo
Published in 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) (14.06.2020)
Published in 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) (14.06.2020)
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Conference Proceeding
The transfer of metallic contamination via contact between solid objects
Borde, Yannick, Danel, Adrien, Roche, Agnes, Brunon, Laetitia, Chevalier, Nicolas
Published in Microelectronic engineering (01.02.2009)
Published in Microelectronic engineering (01.02.2009)
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Journal Article
Conference Proceeding
Comparison of direct-total-reflection X-ray fluorescence, sweeping-total-reflection X-ray fluorescence and vapor phase decomposition-total-reflection X-ray fluorescence applied to the characterization of metallic contamination on semiconductor wafers
Danel, Adrien, Cabuil, Nicolas, Lardin, Thierry, Despois, Dominique, Veillerot, Marc, Geoffroy, Charles, Yamagami, Motoyuki, Kohno, Hiroshi
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.12.2008)
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.12.2008)
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Journal Article
Comprehensive Study of Performance of Silicon Heterojunction Solar Cells Under Electron Irradiation
Guillot, Oceane, Veirman, Jordi, Cariou, Romain, Enjalbert, Nicolas, Danel, Adrien, Aicardi, Corinne, Dubois, Sebastien
Published in 2023 13th European Space Power Conference (ESPC) (02.10.2023)
Published in 2023 13th European Space Power Conference (ESPC) (02.10.2023)
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Conference Proceeding
Characterization of the HCl Absorption & Outgassing Mechanisms by FOUPs' Polymers
Fontaine, Hervé, Borde, Yannick, Brych, Christophe, Danel, Adrien
Published in ECS transactions (01.01.2009)
Published in ECS transactions (01.01.2009)
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Journal Article
Silicon Passivated Contacts Photovoltaic Arrays: A Promising Technology for Space
Cariou, Romain, Enjalbert, Nicolas, Voarino, Philippe, Guillot, Oceane, Jamin, Clement, Danel, Adrien, Charpentier, Jean-Baptiste, Veirman, Jordi, Jay, Frederic, Saillet, Benoit, Barth, Vincent, Dubois, Sebastien
Published in 2023 13th European Space Power Conference (ESPC) (02.10.2023)
Published in 2023 13th European Space Power Conference (ESPC) (02.10.2023)
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Conference Proceeding
Impact of Metallic Contamination on Si: Shortloop Issues
Borde, Yannick, Maurel, Adrien, Danel, Adrien, Roche, Agnes, Veillerot, Marc
Published in ECS transactions (28.09.2007)
Published in ECS transactions (28.09.2007)
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Journal Article
Thin film characterization by total reflection x-ray fluorescence
Danel, Adrien, Nolot, Emmanuel, Veillerot, Marc, Olivier, Ségolène, Decorps, Tifenn, Calvo-Muñoz, Maria-Luisa, Hartmann, Jean-Michel, Lhostis, Sandrine, Kohno, Hiroshi, Yamagami, Motoyuki, Geoffroy, Charles
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.12.2008)
Published in Spectrochimica acta. Part B: Atomic spectroscopy (01.12.2008)
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Journal Article
Impact of the Volatile Acid Contaminants on Copper Interconnects Electrical Performances
Fontaine, Hervé, Feldis, Hélène, Danel, Adrien, Cetre, Sylviane, Ailhas, Christelle
Published in ECS transactions (01.01.2009)
Published in ECS transactions (01.01.2009)
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Journal Article
Dissemination of Metallic Contamination During IC Manufacturing
Danel, Adrien, Borde, Yannick, Maurel, Adrien, Laetitia, Brunon, Royer, Agnes
Published in ECS transactions (28.09.2007)
Published in ECS transactions (28.09.2007)
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Journal Article