Search Results - "DAMIANO, JR. JOHN" :: K.UTB vyhledávací portál

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Electrical devices with edge slits for mounting sample

by Ghassemi, Hessam, Wellenius, Ian Patrick, Damiano, Jr., John, Berthier, Rémy
Year of Publication 18.10.2022

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Electron microscope sample holder fluid handling with independent pressure and flow control

by Carpenter, William Bradford, Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Damiano, Jr., John
Year of Publication 09.01.2024

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SAMPLE SUPPORT WITH FIDUCIAL INDICIA

by WELLENIUS, Ian Patrick, DAMIANO, John Jr
Year of Publication 14.11.2019

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Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

by Franks, Alan Philip, Friend, Joshua, Walden, II, Franklin Stampley, Marusak, Katherine Elizabeth, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Damiano, Jr., John
Year of Publication 29.10.2024

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Automated application of drift correction to sample studied under electron microscope

by Franks, Alan Philip, Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Jacobs, Benjamin, Damiano, Jr., John
Year of Publication 11.06.2024

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Electron microscope sample holder fluid handling with independent pressure and flow control

by Carpenter, William Bradford, Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Damiano, Jr., John
Year of Publication 11.01.2022

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Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

by Franks, Alan Philip, Friend, Joshua, Walden, II, Franklin Stampley, Marusak, Katherine Elizabeth, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Damiano, Jr., John
Year of Publication 12.09.2023

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Automated application of drift correction to sample studied under electron microscope

by Franks, Alan Philip, Larson, Benjamin Bradshaw, Marthe, Jr., Nelson L, Walden, II, Franklin Stampley, Marusak, Katherine Elizabeth, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Jacobs, Benjamin, Friend, Joshua Brian, Damiano, Jr., John
Year of Publication 13.02.2024

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Automated application of drift correction to sample studied under electron microscope

by Franks, Alan Philip, Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Jacobs, Benjamin, Damiano, Jr., John
Year of Publication 18.10.2022

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Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

by Franks, Alan Philip, Friend, Joshua, Walden, II, Franklin Stampley, Marusak, Katherine Elizabeth, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Damiano, Jr., John
Year of Publication 27.09.2022

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Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

by Mick, Stephen E, Nackashi, David P, Damiano, Jr., John
Year of Publication 29.01.2019

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Automated application of drift correction to sample studied under electron microscope

by Franks, Alan Philip, Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Jacobs, Benjamin, Damiano, Jr., John
Year of Publication 26.07.2022

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Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

by Mick, Stephen E, Nackashi, David P, Damiano, Jr., John
Year of Publication 07.08.2018

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Microscopy support structures

by Mick, Stephen E, Nackashi, David P, Damiano, Jr., John
Year of Publication 29.05.2018

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Method for enabling modular part replacement within an electron microscope sample holder

by Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Damiano, Jr., John
Year of Publication 10.03.2020

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Automated application of drift correction to sample studied under electron microscope

by Franks, Alan Philip, Larson, Benjamin Bradshaw, Marthe, Jr., Nelson L, Walden, II, Franklin Stampley, Marusak, Katherine Elizabeth, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Jacobs, Benjamin, Friend, Joshua Brian, Damiano, Jr., John
Year of Publication 29.11.2022

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Method for forming an electrical connection to a sample support in an electron microscope holder

by Mick Stephen E, Nackashi David P, Damiano, Jr. John
Year of Publication 05.12.2017

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MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

by Carpenter, William Bradford, Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Nackashi, David P, Damiano, Jr., John
Year of Publication 15.09.2020

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Method for optimizing fluid flow across a sample within an electron microscope sample holder

by Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Damiano, Jr., John
Year of Publication 06.08.2019

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Automated application of drift correction to sample studied under electron microscope

by Franks, Alan Philip, Walden, II, Franklin Stampley, Gardiner, Daniel Stephen, Nackashi, David P, Uebel, Mark, Jacobs, Benjamin, Damiano, Jr., John
Year of Publication 20.04.2021

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