Capacitively coupled non-contact probing circuits for membrane-based wafer-level simultaneous testing
Daito, M., Nakata, Y., Sasaki, S., Gomyo, H., Kusamitsu, H., Komoto, Y., Iizuka, K., Ikeuchi, K., Kim, G.S., Takamiya, M., Sakurai, T.
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)
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