Ultra-thin MgO(111)-polar sheets grown onto Ag(111)
Sarpi, B., Daineche, R., Girardeaux, C., Hemeryck, A., Vizzini, S.
Published in Applied surface science (15.01.2016)
Published in Applied surface science (15.01.2016)
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Journal Article
Molecular-beam epitaxial growth of tensile-strained and n-doped Ge/Si(001) films using a GaP decomposition source
Luong, T.K.P., Ghrib, A., Dau, M.T., Zrir, M.A., Stoffel, M., Le Thanh, V., Daineche, R., Le, T.G., Heresanu, V., Abbes, O., Petit, M., El Kurdi, M., Boucaud, P., Rinnert, H., Murota, J.
Published in Thin solid films (30.04.2014)
Published in Thin solid films (30.04.2014)
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Journal Article
Conference Proceeding
Oxidation of Mg atomic monolayer onto silicon: A road toward MgOx/Mg2Si (11–1)/Si (100) heterostructure
Sarpi, B., Rochdi, N., Daineche, R., Bertoglio, M., Girardeaux, C., Baronnet, A., Perrin-Toinin, J., Bocquet, M., Djafari Rouhani, M., Hemeryck, A., Vizzini, S.
Published in Surface science (01.12.2015)
Published in Surface science (01.12.2015)
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Journal Article
Correction of secondary ion mass spectrometry profiles for atom diffusion measurements
Portavoce, A., Rodriguez, N., Daineche, R., Grosjean, C., Girardeaux, C.
Published in Materials letters (31.03.2009)
Published in Materials letters (31.03.2009)
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Journal Article
Effect of Si and He implantation in the formation of ultra shallow junctions in Si
Xu, M., Regula, G., Daineche, R., Oliviero, E., Hakim, B., Ntsoenzok, E., Pichaud, B.
Published in Thin solid films (26.02.2010)
Published in Thin solid films (26.02.2010)
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Journal Article
Conference Proceeding
Measurement of As diffusivity in Ni2Si thin films
BLUM, I, PORTAVOCE, A, MANGETINCK, D, DAINECHE, R, HOUMMADA, K, LABAR, J. L, CARRON, V, BERNARDINI, J
Published in Microelectronic engineering (01.03.2010)
Published in Microelectronic engineering (01.03.2010)
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Conference Proceeding
Journal Article
Oxidation of Mg atomic monolayer onto silicon: A road toward MgOx/Mg 2 Si (11–1)/Si (100) heterostructure
Sarpi, B., Rochdi, N., Daineche, Rachid, Bertoglio, M., Girardeaux, Christophe, Baronnet, A., Perrin-Toinin, J., Bocquet, Michael, Djafari Rouhani, M., Hemeryck, A., Vizzini, S.
Published in Surface science (01.12.2015)
Published in Surface science (01.12.2015)
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Journal Article
Correction of secondary ion mass spectrometry profiles for atom diffusion measurements
Portavoce, A., Rodriguez, N., Daineche, R., Grosjean, C., Girardeaux, C.
Published in Materials letters (01.03.2009)
Published in Materials letters (01.03.2009)
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Journal Article
Measurement of As diffusivity in Ni 2Si thin films
Blum, I., Portavoce, A., Mangelinck, D., Daineche, R., Hoummada, K., Lábár, J.L., Carron, V., Bernardini, J.
Published in Microelectronic engineering (2010)
Published in Microelectronic engineering (2010)
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Journal Article