Nanometre-scale oxidation of silicon surfaces by dynamic force microscopy: reproducibility, kinetics and nanofabrication
Calleja, M, Anguita, J, Garcia, R, Birkelund, K, Pérez-Murano, F, Dagata, J A
Published in Nanotechnology (01.03.1999)
Published in Nanotechnology (01.03.1999)
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Conference Proceeding
Device Fabrication by Scanned Probe Oxidation
Dagata, J. A.
Published in Science (American Association for the Advancement of Science) (08.12.1995)
Published in Science (American Association for the Advancement of Science) (08.12.1995)
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Large scale high precision nano-oxidation using an atomic force microscope
Kuramochi, H., Ando, K., Tokizaki, T., Yasutake, M., Pérez-Murano, F., Dagata, J.A., Yokoyama, H.
Published in Surface science (20.09.2004)
Published in Surface science (20.09.2004)
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The role of subsurface oxygen in the local oxidation of zirconium and zirconium nitride thin films
Farkas, N., Zhang, G., Donnelly, K.M., Evans, E.A., Ramsier, R.D., Dagata, J.A.
Published in Thin solid films (30.01.2004)
Published in Thin solid films (30.01.2004)
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High-voltage SPM oxidation of ZrN: materials for multiscale applications
Farkas, N, Comer, J R, Zhang, G, Evans, E A, Ramsier, R D, Dagata, J A
Published in Nanotechnology (01.02.2005)
Published in Nanotechnology (01.02.2005)
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High-voltage nanoimprint lithography of refractory metal films
Farkas, N, Ramsier, R D, Dagata, J A
Published in Journal of nanoscience and nanotechnology (01.07.2010)
Published in Journal of nanoscience and nanotechnology (01.07.2010)
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Physical characterization methods for iron oxide contrast agents encapsulated within a targeted liposome-based delivery system
Dagata, J A, Farkas, N, Dennis, C L, Shull, R D, Hackley, V A, Yang, C, Pirollo, K F, Chang, E H
Published in Nanotechnology (30.07.2008)
Published in Nanotechnology (30.07.2008)
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Why nano-oxidation with carbon nanotube probes is so stable: II. Bending behaviour of CNT probes during nano-oxidation
Kuramochi, H, Tokizaki, T, Ando, K, Yokoyama, H, Dagata, J A
Published in Nanotechnology (04.04.2007)
Published in Nanotechnology (04.04.2007)
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Imaging of passivated III–V semiconductor surfaces by a scanning tunneling microscope operating in air
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Conference Proceeding
Optical characterization of the electrical properties of processed GaAs
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Conference Proceeding
Angular momentum coupling in molecular Rydberg states
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Conference Proceeding
MPI/MS detection of SiF and SiF2 radicals produced from the reaction of F2 and NF3 with silicon
DAGATA, J. A, SQUIRE, D. W, DULCEY, C. S, HSU, D. S. Y, LIN, M. C
Published in Chemical physics letters (20.02.1987)
Published in Chemical physics letters (20.02.1987)
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