A comprehensive framework for cell-aware diagnosis of customer returns
d'Hondt, P., Mhamdi, S., Girard, P., Virazel, A., Ladhar, A.
Published in Microelectronics and reliability (01.08.2022)
Published in Microelectronics and reliability (01.08.2022)
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Journal Article
A Comprehensive Learning-Based Flow for Cell-Aware Model Generation
D'Hondt, P., Ladhar, A., Girard, P., Virazel, A.
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding
A Learning-Based Methodology for Accelerating Cell-Aware Model Generation
d'Hondt, P., Ladhar, A., Girard, P., Virazel, A.
Published in 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.02.2021)
Published in 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.02.2021)
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Conference Proceeding