Scalability of strained-Si nMOSFETs down to 25 nm gate length
Jung-Suk Goo, Qi Xiang, Takamura, Y., Haihong Wang, Pan, J., Arasnia, F., Paton, E.N., Besser, P., Sidorov, M.V., Adem, E., Lochtefeld, A., Braithwaite, G., Currie, M.T., Hammond, R., Bulsara, M.T., Ming-Ren Lin
Published in IEEE electron device letters (01.05.2003)
Published in IEEE electron device letters (01.05.2003)
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Journal Article
Dislocation dynamics in relaxed graded composition semiconductors
Fitzgerald, E.A, Kim, A.Y, Currie, M.T, Langdo, T.A, Taraschi, G, Bulsara, M.T
Published in Materials science & engineering. B, Solid-state materials for advanced technology (08.12.1999)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (08.12.1999)
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Journal Article
Conference Proceeding
Strained Si on insulator technology: from materials to devices
Langdo, T.A, Currie, M.T, Cheng, Z.-Y, Fiorenza, J.G, Erdtmann, M, Braithwaite, G, Leitz, C.W, Vineis, C.J, Carlin, J.A, Lochtefeld, A, Bulsara, M.T, Lauer, I, Antoniadis, D.A, Somerville, M
Published in Solid-state electronics (01.08.2004)
Published in Solid-state electronics (01.08.2004)
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Journal Article
Analysis of carrier generation lifetime in strained-Si/SiGe heterojunction MOSFETs from capacitance transient
Bera, L.K., Mathew, Shajan, Balasubramanian, N., Braithwaite, G., Currie, M.T., Singaporewala, F., Yap, J., Hammond, R., Lochtefeld, A., Bulsara, M.T., Fitzgerald, E.A.
Published in Applied surface science (15.03.2004)
Published in Applied surface science (15.03.2004)
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Journal Article
Conference Proceeding
Fully depleted n-MOSFETs on supercritical thickness strained SOI
Lauer, I., Langdo, T.A., Cheng, Z.-Y., Fiorenza, J.G., Braithwaite, G., Currie, M.T., Leitz, C.W., Lochtefeld, A., Badawi, H., Bulsara, M.T., Somerville, M., Antoniadis, D.A.
Published in IEEE electron device letters (01.02.2004)
Published in IEEE electron device letters (01.02.2004)
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Journal Article
N2O oxidation of strained-Si/relaxed-SiGe heterostructure grown by UHVCVD
Tan, C.S., Choi, W.K., Bera, L.K., Pey, K.L., Antoniadis, D.A., Fitzgerald, E.A., Currie, M.T., Maiti, C.K.
Published in Solid-state electronics (01.11.2001)
Published in Solid-state electronics (01.11.2001)
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Journal Article
N 2O oxidation of strained-Si/relaxed-SiGe heterostructure grown by UHVCVD
Tan, C.S., Choi, W.K., Bera, L.K., Pey, K.L., Antoniadis, D.A., Fitzgerald, E.A., Currie, M.T., Maiti, C.K.
Published in Solid-state electronics (2001)
Published in Solid-state electronics (2001)
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Journal Article
Investigation of misfit dislocation leakage in supercritical strained silicon MOSFETs
Fiorenza, J.G., Braithwaite, G., Leitz, C., Currie, M.T., Cheng, Z.Y., Yang, V.K., Langdo, T., Carlin, J., Somerville, M., Lochtefeld, A., Badawi, H., Bulsara, M.T.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
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Conference Proceeding
SiGe-On-Insulator (SGOI): substrate preparation and MOSFET fabrication for electron mobility evaluation
Zhi-Yuan Cheng, Currie, M.T., Leitz, C.W., Taraschi, G., Pitera, A., Lee, M.L., Langdo, T.A., Hoyt, J.L., Antoniadis, D.A., Fitzgerald, E.A.
Published in 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207) (2001)
Published in 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207) (2001)
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Conference Proceeding
A new ultra-hard etch-stop layer for high precision micromachining
Borenstein, J.T., Gerrish, N.D., Currie, M.T., Fitzgerald, E.A.
Published in Technical Digest. IEEE International MEMS 99 Conference. Twelfth IEEE International Conference on Micro Electro Mechanical Systems (Cat. No.99CH36291) (1999)
Published in Technical Digest. IEEE International MEMS 99 Conference. Twelfth IEEE International Conference on Micro Electro Mechanical Systems (Cat. No.99CH36291) (1999)
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Conference Proceeding
Impact of threading dislocations on both n/p and p/n single junction GaAs cells grown on Ge/SiGe/Si substrates
Andre, C.L., Khan, A., Gonzalez, M., Hudait, M.K., Fitzgerald, E.A., Carlin, J.A., Currie, M.T., Leitz, C.W., Langdo, T.A., Clark, E.B., Wilt, D.M., Ringel, S.A.
Published in Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002 (2002)
Published in Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002 (2002)
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Conference Proceeding
DC and RF characterization of fully depleted strained SOI MOSFETs
Chen, C.L., Langdo, T.A., Chen, C.K., Fiorenza, J.G., Wyatt, P.W., Currie, M.T., Leitz, C.W., Braithwaite, G., Fritze, M., Lambert, R., Yost, D.-R., Cheng, Z., Lochtefeld, A., Keast, C.K.
Published in 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) (2004)
Published in 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) (2004)
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Conference Proceeding