by Van der Plas, G, Limaye, P, Loi, I, Mercha, A, Oprins, H, Torregiani, C, Thijs, S, Linten, D, Stucchi, M, Katti, G, Velenis, D, Cherman, V, Vandevelde, B, Simons, V, De Wolf, I, Labie, R, Perry, D, Bronckers, S, Minas, N, Cupac, M, Ruythooren, W, Van Olmen, J, Phommahaxay, A, de Potter de ten Broeck, M, Opdebeeck, A, Rakowski, M, De Wachter, B, Dehan, M, Nelis, M, Agarwal, R, Pullini, A, Angiolini, F, Benini, L, Dehaene, W, Travaly, Y, Beyne, E, Marchal, P
Published in IEEE journal of solid-state circuits (01.01.2011)

by Van der Plas, G., Limaye, P., Mercha, A., Oprins, H., Torregiani, C., Thijs, S., Linten, D., Stucchi, M., Guruprasad, K., Velenis, D., Shinichi, D., Cherman, V., Vandevelde, B., Simons, V., De Wolf, I., Labie, R., Perry, D., Bronckers, S., Minas, N., Cupac, M., Ruythooren, W., Van Olmen, J., Phommahaxay, A., de Potter de ten Broeck, M., Opdebeeck, A., Rakowski, M., De Wachter, B., Dehan, M., Nelis, M., Agarwal, R., Dehaene, W., Travaly, Y., Marchal, P., Beyne, E.
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)

by Minas, Nikolaos, Van der Plas, Geert, Oprins, Herman, Yu Yang, Okoro, Chuckwudi, Mercha, Abdelkarim, Cherman, Vladimir, Torregiani, Cristina, Perry, Dan, Cupac, Miro, Rakowski, Michal, Marchal, Pol
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)

by Van der Plas, G, Thijs, S, Linten, D, Katti, G, Limaye, P, Mercha, A, Stucchi, M, Oprins, H, Vandevelde, B, Minas, N, Cupac, M, Dehan, M, Nelis, M, Agarwal, R, Dehaene, W, Travaly, Y, Beyne, E, Marchal, P
Published in IEEE Custom Integrated Circuits Conference 2010 (01.09.2010)

by De Sutter, Bjorn, Mei, Bingfeng, Bartic, Andrei, Aa, Tom Vander, Berekovic, Mladen, Mignolet, Jean-Yves, Croes, Kris, Coene, Paul, Cupac, Miro, Couvreur, Aïssa, Folens, Andy, Dupont, Steven, Van Thielen, Bert, Kanstein, Andreas, Kim, Hong-Seok, Kim, Suk Jin
Published in Lecture notes in computer science (2006)

by Marchal, P, Van der Plas, G, Limaye, P, Mercha, A, Thijs, S, Linten, D, Guruprasad, K, Stucchi, M, Vandevelde, B, Bronckers, S, Minas, N, Cupac, M, Dehan, M, Nelis, M, Agarwal, R, Dehaene, W, Travaly, Y, Beyne, E
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)