Tomography of memory engrams in self-organizing nanowire connectomes
Milano, Gianluca, Cultrera, Alessandro, Boarino, Luca, Callegaro, Luca, Ricciardi, Carlo
Published in Nature communications (27.09.2023)
Published in Nature communications (27.09.2023)
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Journal Article
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation
Cultrera, Alessandro, Milano, Gianluca, De Leo, Natascia, Ricciardi, Carlo, Boarino, Luca, Callegaro, Luca
Published in Scientific reports (23.06.2021)
Published in Scientific reports (23.06.2021)
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Journal Article
Active Energy Meters Tested in Realistic Non-Sinusoidal Conditions Recorded on the Field and Reproduced in Laboratory
Cultrera, Alessandro, Germito, Gabriele, Serazio, Danilo, Galliana, Flavio, Trinchera, Bruno, Aprile, Giulia, Chirulli, Martino, Callegaro, Luca
Published in Energies (Basel) (01.03.2024)
Published in Energies (Basel) (01.03.2024)
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Journal Article
Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale
Melios, Christos, Huang, Nathaniel, Callegaro, Luca, Centeno, Alba, Cultrera, Alessandro, Cordon, Alvaro, Panchal, Vishal, Arnedo, Israel, Redo-Sanchez, Albert, Etayo, David, Fernandez, Montserrat, Lopez, Alex, Rozhko, Sergiy, Txoperena, Oihana, Zurutuza, Amaia, Kazakova, Olga
Published in Scientific reports (21.02.2020)
Published in Scientific reports (21.02.2020)
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Journal Article
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials
Milano, Gianluca, Cultrera, Alessandro, Bejtka, Katarzyna, De Leo, Natascia, Callegaro, Luca, Ricciardi, Carlo, Boarino, Luca
Published in ACS applied nano materials (24.12.2020)
Published in ACS applied nano materials (24.12.2020)
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Journal Article
A calibration-verification testbed for electrical energy meters under low power quality conditions
Callegaro, Luca, Aprile, Giulia, Cultrera, Alessandro, Galliana, Flavio, Germito, Gabriele, Serazio, Danilo, Trinchera, Bruno
Published in Measurement. Sensors (01.12.2021)
Published in Measurement. Sensors (01.12.2021)
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Journal Article
Molecular doping and gas sensing in Si nanowires: From charge injection to reduced dielectric mismatch
Amato, Giampiero, Cultrera, Alessandro, Boarino, Luca, Lamberti, Carlo, Bordiga, Silvia, Mercuri, Francesco, Cartoixà, Xavier, Rurali, Riccardo
Published in Journal of applied physics (28.11.2013)
Published in Journal of applied physics (28.11.2013)
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Journal Article
Electrical Resistance Tomography of Conductive Thin Films
Cultrera, Alessandro, Callegaro, Luca
Published in IEEE transactions on instrumentation and measurement (01.09.2016)
Published in IEEE transactions on instrumentation and measurement (01.09.2016)
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Journal Article
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods
Cultrera, Alessandro, Serazio, Danilo, Fabricius, Norbert, Callegaro, Luca
Published in Measurement : journal of the International Measurement Confederation (15.08.2024)
Published in Measurement : journal of the International Measurement Confederation (15.08.2024)
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Journal Article
Metrological Characterization of Consumer-Grade Equipment for Wearable Brain-Computer Interfaces and Extended Reality
Arpaia, Pasquale, Callegaro, Luca, Cultrera, Alessandro, Esposito, Antonio, Ortolano, Massimo
Published in IEEE transactions on instrumentation and measurement (2022)
Published in IEEE transactions on instrumentation and measurement (2022)
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Journal Article
A correlation noise spectrometer for flicker noise measurement in graphene samples
Marzano, Martina, Cultrera, Alessandro, Ortolano, Massimo, Callegaro, Luca
Published in Measurement science & technology (01.03.2019)
Published in Measurement science & technology (01.03.2019)
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Journal Article
Mapping the conductivity of graphene with Electrical Resistance Tomography
Cultrera, Alessandro, Serazio, Danilo, Zurutuza, Amaia, Centeno, Alba, Txoperena, Oihana, Etayo, David, Cordon, Alvaro, Redo-Sanchez, Albert, Arnedo, Israel, Ortolano, Massimo, Callegaro, Luca
Published in Scientific reports (23.07.2019)
Published in Scientific reports (23.07.2019)
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Journal Article
Traceable Measurements of Mutual Inductance Standards Applied to Large Capacitance Simulation in Electrochemical Impedance Spectroscopy
Medved, Juan, Cultrera, Alessandro, Marzano, Martina, D'Elia, Vincenzo, Ortolano, Massimo, Callegaro, Luca
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
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Conference Proceeding
Calibration of Magnitude Error of Lock-in Amplifiers and Noise Response
Cultrera, Alessandro, Medved, Juan, Ortolano, Massimo, Durandetto, Paolo, Sosso, Andrea, Callegaro, Luca
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
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Conference Proceeding
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison
Cultrera, Alessandro, Corminboeuf, David, D'Elia, Vincenzo, Tran, Ngoc Thanh Mai, Callegaro, Luca, Ortolano, Massimo
Published in Metrologia (01.04.2021)
Published in Metrologia (01.04.2021)
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Journal Article
Memristive devices for metrological applications
Cabral, Vitor, Cultrera, Alessandro, Chen, Shaochuan, Pereira, João, Ribeiro, Luís, Godinho, Isabel, Boarino, Luca, De Leo, Nastacia, Callegaro, Luca, Cardoso, Susana, Valov, Ilia, Milano, Gianluca
Published in Acta IMEKO (01.01.2023)
Published in Acta IMEKO (01.01.2023)
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Journal Article
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications
Arpaia, Pasquale, Callegaro, Luca, Cultrera, Alessandro, Esposito, Antonio, Ortolano, Massimo
Published in 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) (07.06.2021)
Published in 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) (07.06.2021)
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Conference Proceeding