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Effects of Measurement Noise on Flocking Dynamics of Cucker-Smale Systems
Chen, Duxin, Li, Wang, Liu, Xiaolu, Yu, Wenwu, Sun, Yongzheng
Published in IEEE transactions on circuits and systems. II, Express briefs (01.10.2020)
Published in IEEE transactions on circuits and systems. II, Express briefs (01.10.2020)
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