by Ji, Dong, Li, Wenwen, Agarwal, Anchal, Chan, Silvia H., Haller, Jeffrey, Bisi, Davide, Labrecque, Michelle, Gupta, Chirag, Cruse, Bill, Lal, Rakesh, Keller, Stacia, Mishra, Umesh K., Chowdhury, Srabanti
Published in IEEE electron device letters (01.07.2018)

by Ji, Dong, Li, Wenwen, Agarwal, Anchal, Chan, Silvia H., Haller, Jeffrey, Bisi, Davide, Labrecque, Michelle, Gupta, Chirag, Cruse, Bill, Lal, Rakesh, Keller, Stacia, Mishra, Umesh K., Chowdhury, Srabanti
Published in IEEE electron device letters (01.07.2018)

by Bisi, Davide, Cruse, Bill, Zuk, Philip, Parikh, Primit, Mishra, Umesh, Hosoda, Tsutomu, Kamiyama, Masamichi, Kanamura, Masahito
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by Bisi, Davide, Gritters, John, Hosoda, Tsutomu, Kamiyama, Masamichi, Cruse, Bill, Huang, YuLu, McKay, Jim, Gupta, Geetak, Lal, Rakesh, Neufeld, Carl, Zuk, Philip, Wu, YiFeng, Parikh, Primit, Mishra, Umesh
Published in 2021 IEEE Applied Power Electronics Conference and Exposition (APEC) (14.06.2021)

by Bisi, Davide, Nguyen, Long, Zuk, Philip, Gokhale, Ashish, Coffey, Keith, Liu, Ted, Cruse, Bill, Hosoda, Tsutomu, Kamiyama, Masamichi, Parikh, Primit, Mishra, Umesh
Published in 2022 IEEE Applied Power Electronics Conference and Exposition (APEC) (20.03.2022)