The Effect of Gate-Bias Stress and Temperature on the Performance of ZnO Thin-Film Transistors
Cross, R.B.M., De Souza, M.M.
Published in IEEE transactions on device and materials reliability (01.06.2008)
Published in IEEE transactions on device and materials reliability (01.06.2008)
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Magazine Article
Investigating the Stability of Thin Film Transistors with Zinc Oxide as the Channel Layer
Cross, R.B.M., De Souza, M.M.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
Rare-Earth Based Oxide and Nitride Thin Films Employing Volatile Homoleptic Guanidinate Precursors
Milanov, Andrian P., Thiede, Tobias, Hellwig, Malte, Parala, Harish, Bock, Claudia, Becker, Hans-Werner, Ngwashi, Divine, Cross, Richard, Paul, Shashi, Kunze, Ulrich, Fischer, Roland, Devi, Anjana
Published in ECS transactions (01.01.2009)
Published in ECS transactions (01.01.2009)
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Journal Article
Creativity - a catalyst for technological innovation
Coconete, D.E., Moguilnaia, N.A., Cross, R.B.M., De Souza, P.E., Sankara Narayanan, E.M.
Published in IEMC '03 Proceedings. Managing Technologically Driven Organizations: The Human Side of Innovation and Change (2003)
Published in IEMC '03 Proceedings. Managing Technologically Driven Organizations: The Human Side of Innovation and Change (2003)
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Conference Proceeding