Quantification of nanoscale precipitation in AA7050 using X-ray scattering, electron microscopy and automated particle counting techniques
Stubbers, Alyssa, Zhu, Ning, Cramer, Jillian J., Eden, Timothy J., Naccarelli, Anthony J., Brewer, Luke N., Balk, T. John
Published in Materials characterization (01.12.2024)
Published in Materials characterization (01.12.2024)
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