Contribution of Electromagnetic Perturbation to the Transient Response of an Electronic Circuit Exposed to a High Multi-MeV X-Ray Flux
Ribiere, M., Demarquay, S., Maulois, M., Maisonny, R., DaAlmeida, T., Toury, M., Crabos, B., Gonzalez, C., Garrigues, A., Delbos, C., Azais, B.
Published in IEEE transactions on nuclear science (01.06.2015)
Published in IEEE transactions on nuclear science (01.06.2015)
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