Reliability of ESD protection devices designed in a 3D technology
Courivaud, B., Nolhier, N., Ferru, G., Bafleur, M., Caignet, F.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
Get full text
Journal Article
Conference Proceeding
Novel 3D back-to-back diodes ESD protection
Courivaud, B., Nolhier, N., Ferru, G., Bafleur, M., Caignet, F.
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
Get full text
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
Conference Proceeding