Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging
De Castro, Olivier, Audinot, Jean-Nicolas, Hoang, Hung Quang, Coulbary, Chérif, Bouton, Olivier, Barrahma, Rachid, Ost, Alexander, Stoffels, Charlotte, Jiao, Chengge, Dutka, Mikhail, Geryk, Michal, Wirtz, Tom
Published in Analytical chemistry (Washington) (02.08.2022)
Published in Analytical chemistry (Washington) (02.08.2022)
Get full text
Journal Article