The revolution in SiGe: impact on device electronics
Harame, D.L, Koester, S.J, Freeman, G, Cottrel, P, Rim, K, Dehlinger, G, Ahlgren, D, Dunn, J.S, Greenberg, D, Joseph, A, Anderson, F, Rieh, J.-S, Onge, S.A.S.T, Coolbaugh, D, Ramachandran, V, Cressler, J.D, Subbanna, S
Published in Applied surface science (15.03.2004)
Published in Applied surface science (15.03.2004)
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