A novel technique for epitaxy tool-to-tool and chamber matching and optimization: ER: Equipment reliability and productivity enhancements
Cosway, Richard G., Burch, Steven R., Rosser, Andrew D., Lazok, Phillip T.
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)
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Conference Proceeding
Journal Article
What does the Edinburgh high-risk study tell us about schizophrenia?
Johnstone, Eve C, Lawrie, Stephen M, Cosway, Richard
Published in American journal of medical genetics (08.12.2002)
Published in American journal of medical genetics (08.12.2002)
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Journal Article
Measurement of lateral preferences and schizophrenia: results of the Edinburgh High-Risk Study and methodological issues
Byrne, Majella, Clafferty, Robert A, Cosway, Richard, Grant, Elizabeth, Hodges, Ann, Lawrie, Stephen M, Johnstone, Eve C
Published in Psychiatry research (15.03.2004)
Published in Psychiatry research (15.03.2004)
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Journal Article
The association between neuropsychology and psychotic symptoms in the Edinburgh high risk for schizophrenia study
Byrne, Majella, Cosway, Richard, Hodges, Ann, Grant, Elizabeth, Clafferty, Bobby, Lawrie, Steven, Cunningham Owens, David, Johnstone, Eve C.
Published in Schizophrenia research (2000)
Published in Schizophrenia research (2000)
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Journal Article
The Coping Inventory for Stressful Situations: Factorial Structure and Associations With Personality Traits and Psychological Health1
Cosway, Richard, Endler, Norman S., Sadler, Andrew J., Deary, Ian J.
Published in Journal of applied biobehavioral research (01.07.2000)
Published in Journal of applied biobehavioral research (01.07.2000)
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Journal Article
Neuropsychology, genetic liability, and psychotic symptoms in those at high risk of schizophrenia
Byrne, Majella, Clafferty, Bobby A, Cosway, Richard, Grant, Elizabeth, Hodges, Ann, Whalley, Heather C, Lawrie, Stephen M, Owens, David G Cunningham, Johnstone, Eve C
Published in Journal of abnormal psychology (1965) (01.02.2003)
Published in Journal of abnormal psychology (1965) (01.02.2003)
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Journal Article
A novel method for statistical process control of gate oxide and front-end cleans monitoring in a manufacturing environment
Cosway, R.G., Pirastehfar, L.S., Root, R.P., Roche, T.S., Naujokaitis, J.R.
Published in 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) (2000)
Published in 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) (2000)
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Conference Proceeding
Effect of polysilicon gate pattern/doping sequence on gate oxide degradation
TAYLOR, M. A, FLOWERS, D. L, COSWAY, R
Published in Journal of the Electrochemical Society (01.11.1987)
Published in Journal of the Electrochemical Society (01.11.1987)
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Journal Article