Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope
Wang, Peng, Behan, Gavin, Kirkland, Angus I., Nellist, Peter D., Cosgriff, Eireann C., D’Alfonso, Adrian J., Morgan, Andrew J., Allen, Leslie J., Hashimoto, Ayako, Takeguchi, Masaki, Mitsuishi, Kazutaka, Shimojo, Masayuki
Published in Ultramicroscopy (01.06.2011)
Published in Ultramicroscopy (01.06.2011)
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Interface location by depth sectioning using a low-angle annular dark field detector
Ruben, Gary, Cosgriff, Eireann C., D'Alfonso, Adrian J., Findlay, Scott D., LeBeau, James M., Allen, Leslie J.
Published in Ultramicroscopy (01.02.2012)
Published in Ultramicroscopy (01.02.2012)
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Observation of van der Waals Driven Self-Assembly of MoSI Nanowires into a Low-Symmetry Structure Using Aberration-Corrected Electron Microscopy
Nicolosi, V., Nellist, P. D., Sanvito, S., Cosgriff, E. C., Krishnamurthy, S., Blau, W. J., Green, M. L. H., Vengust, D., Dvorsek, D., Mihailovic, D., Compagnini, G., Sloan, J., Stolojan, V., Carey, J. D., Pennycook, S. J., Coleman, J. N.
Published in Advanced materials (Weinheim) (19.02.2007)
Published in Advanced materials (Weinheim) (19.02.2007)
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