Thermomechanical model of an oxide-confined GaAs-based VCSEL emitter
Coppeta, R.A., Fabbro, R., Pusterhofer, M., Haber, T., Fasching, G.
Published in Microelectronics and reliability (01.01.2023)
Published in Microelectronics and reliability (01.01.2023)
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Journal Article
Residual strain around a through-silicon via
Coppeta, R.A., Pusterhofer, M., Zisser, W., Kravchenko, G.
Published in Microelectronics and reliability (01.09.2022)
Published in Microelectronics and reliability (01.09.2022)
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Journal Article
Evaluation of dislocation energy in thin films
Coppeta, R.A., Holec, D., Ceric, H., Grasser, T.
Published in Philosophical magazine (Abingdon, England) (12.01.2015)
Published in Philosophical magazine (Abingdon, England) (12.01.2015)
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Journal Article