Field Oxide Inversion Effects in Irradiated CMOS Devices
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Current Induced Avalanche in Epitaxial Structures
Wrobel, T. F., Coppage, F. N., Hash, G. L., Smith, A. J.
Published in IEEE transactions on nuclear science (01.12.1985)
Published in IEEE transactions on nuclear science (01.12.1985)
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MOS-Transistor Radiation Detectors and X-Ray Dose-Enhancement Effects
Posey, L. D., Wrobel, T. F., Evans, D. C., Beezhold, W., Kelly, J. G., MacCallum, C. J., Coppage, F. N., Luera, T. F., Lorence, L. J., Smith, A. J.
Published in IEEE transactions on nuclear science (01.12.1985)
Published in IEEE transactions on nuclear science (01.12.1985)
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Transient Radiation Effects Evaluation of the F-8 Microprocessor
Coppage, F. N., Barnum, J. H., Collins, C., Corbett, W., Measel, P., Wahlin, K.
Published in IEEE transactions on nuclear science (01.01.1981)
Published in IEEE transactions on nuclear science (01.01.1981)
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Dependence of ionizing radiation induced hFE degradation on emitter periphery
Pease, R. L., Coppage, F. N., Graham, E. D.
Published in IEEE transactions on nuclear science (01.04.1974)
Published in IEEE transactions on nuclear science (01.04.1974)
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SAND83-1541C Seeing through the Latch-Up Window
Coppage, F. N., Allen, D. J., Dressendorfer, P. V., Ochoa, A., Rauchfuss, J., Wrobel, T. F.
Published in IEEE transactions on nuclear science (1983)
Published in IEEE transactions on nuclear science (1983)
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Journal Article
Dependence of ionizing radiation induced h FE degradation on emitter periphery
Pease, R. L., Coppage, F. N., Graham, E. D.
Published in IEEE transactions on nuclear science (01.04.1974)
Published in IEEE transactions on nuclear science (01.04.1974)
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Journal Article
Gamma-Ray and Neutron-Induced Conductivity in Insulating Materials
Harrison, S. E., Coppage, F. N., Snyder, A. W.
Published in IEEE transactions on nuclear science (01.11.1963)
Published in IEEE transactions on nuclear science (01.11.1963)
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Journal Article
MOS-transistor radiation detectors and X-ray dose-enhancement effects
Posey, L D, Wrobel, T F, Evans, D C, Beezhold, W, Kelly, J G
Published in IEEE transactions on nuclear science (01.12.1985)
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Published in IEEE transactions on nuclear science (01.12.1985)
Journal Article
Gamma-Induced Leakage in Junction Field-Effect Transistors
Allen, Douglas J., Coppage, Floyd N., Hash, Gerald L., Holck, Donald K., Wrobel, Theodore F.
Published in IEEE transactions on nuclear science (01.01.1984)
Published in IEEE transactions on nuclear science (01.01.1984)
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