Current status and future trends of SiGe BiCMOS technology
Harame, D.L., Ahlgren, D.C., Coolbaugh, D.D., Dunn, J.S., Freeman, G.G., Gillis, J.D., Groves, R.A., Hendersen, G.N., Johnson, R.A., Joseph, A.J., Subbanna, S., Victor, A.M., Watson, K.M., Webster, C.S., Zampardi, P.J.
Published in IEEE transactions on electron devices (01.11.2001)
Published in IEEE transactions on electron devices (01.11.2001)
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Journal Article
SiGe BiCMOS Trends - Today and Tomorrow
Dunn, J., Harame, D.L., Joseph, A.J., St Onge, S.A., Feilchenfeld, N.B., Lanzerotti, L., Orner, B., Gebreselasie, E., Johnson, J.B., Coolbaugh, D.D., Rassel, R., Khater, M.
Published in IEEE Custom Integrated Circuits Conference 2006 (01.09.2006)
Published in IEEE Custom Integrated Circuits Conference 2006 (01.09.2006)
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Conference Proceeding
Enabling RFCMOS solutions for emerging advanced applications
Pekarik, J.J., Coolbaugh, D.D., Cottrell, P.E., Csutak, S.M., Greenberg, D.R., Jagannathan, B., Sanderson, D.I., Wagner, L., Walko, J., Xudong Wang, Watts, J.
Published in European Gallium Arsenide and Other Semiconductor Application Symposium, GAAS 2005 (2005)
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Published in European Gallium Arsenide and Other Semiconductor Application Symposium, GAAS 2005 (2005)
Conference Proceeding