Pore- and micro-structural characterization of a novel structural binder based on iron carbonation
Das, Sumanta, Stone, David, Convey, Diana, Neithalath, Narayanan
Published in Materials characterization (01.12.2014)
Published in Materials characterization (01.12.2014)
Get full text
Journal Article
Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry
Hilfiker, James N., Singh, Neha, Tiwald, Tom, Convey, Diana, Smith, Steven M., Baker, Jeffrey H., Tompkins, Harland G.
Published in Thin solid films (30.09.2008)
Published in Thin solid films (30.09.2008)
Get full text
Journal Article
Conference Proceeding
Spectroscopic ellipsometry measurements of thin metal films
Tompkins, Harland G., Tasic, Sonja, Baker, Jeff, Convey, Diana
Published in Surface and interface analysis (01.03.2000)
Published in Surface and interface analysis (01.03.2000)
Get full text
Journal Article
Conference Proceeding
Optimizing the ellipsometric analysis of a transparent layer on glass
Tompkins, Harland G., Smith, Steven, Convey, Diana
Published in Surface and interface analysis (01.12.2000)
Published in Surface and interface analysis (01.12.2000)
Get full text
Journal Article
Determining the amount of Si-Si bonding in CVD oxynitrides
Tompkins, Harland G., Smith, Steven, Convey, Diana, Gregory, R. B., Kottke, M. L., Collins, David
Published in Surface and interface analysis (01.02.2003)
Published in Surface and interface analysis (01.02.2003)
Get full text
Journal Article
Conference Proceeding
Effect of process parameters on the optical constants of thin metal films
Tompkins, Harland G., Baker, Jeffrey H., Convey, Diana
Published in Surface and interface analysis (01.03.2000)
Published in Surface and interface analysis (01.03.2000)
Get full text
Journal Article
Conference Proceeding
Integrated multi-wavelength Fabry-Perot filter and method of fabrication
Le, Ngoc V, Baker, Jeffrey H, Convey, Diana J, Holm, Paige M, Smith, Steven M
Year of Publication 27.05.2008
Get full text
Year of Publication 27.05.2008
Patent
Spectroscopic ellipsometry and reflectometry: a user's perspective
Tompkins, H.G., Baker, J.H., Smith, S., Convey, D.
Published in 2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497) (2000)
Published in 2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497) (2000)
Get full text
Conference Proceeding
Integrated multi-wavelength Fabry-Perot filter and method of fabrication
HOLM PAIGE M, CONVEY DIANA J, SMITH STEVEN M, LE NGOC V, BAKER JEFFREY H
Year of Publication 27.05.2008
Get full text
Year of Publication 27.05.2008
Patent
INTEGRATED MULTI-WAVELENGTH FABRY-PEROT FILTER AND METHOD OF FABRICATION
BAKER, JEFFREY H, HOLM, PAIGE M, LE, NGOC V, SMITH, STEVEN M, CONVEY, DIANA J
Year of Publication 29.11.2007
Get full text
Year of Publication 29.11.2007
Patent
INTEGRATED MULTI-WAVELENGTH FABRY-PEROT FILTER AND METHOD OF FABRICATION
BAKER, JEFFREY H, HOLM, PAIGE M, LE, NGOC V, SMITH, STEVEN M, CONVEY, DIANA J
Year of Publication 27.09.2007
Get full text
Year of Publication 27.09.2007
Patent
Integrated multi-wavelength fabry-perot filter and method of fabrication
HOLM PAIGE M, CONVEY DIANA J, SMITH STEVEN M, LE NGOC V, BAKER JEFFREY H
Year of Publication 27.09.2007
Get full text
Year of Publication 27.09.2007
Patent